Abstract: A method of growing a silicon oxide layer on a silicon substrate by means of a thermal oxidation in a furnace in the presence of a gaseous mixture, said mixture comprising oxygen and Cl2, said Cl2 being generated by an organic chlorine-carbon source, particularly oxalyl chloride. This method is directed to the growth of (ultra) thin silicon oxides and/or the cleaning of a substrate using a low oxidation power. Consequently the method disclosed is especially suited for temperature below 700° C. and for oxidation ambients containing only small amounts of oxygen.
Type:
Grant
Filed:
November 26, 1997
Date of Patent:
May 14, 2002
Assignees:
Imec (vzw), ASM International, Olin
Inventors:
Paul Mertens, Michael McGeary, Hessel Sprey, Karine Kenis, Marc Schaekers, Marc Heyns