Abstract: Disclosed is a test stand that supports and stabilizes a handheld XRF analyzer, and holds a body of sample to be tested. The test stand allows both horizontal and vertical analysis positions of the analyzer. The preferred embodiment of the test stand comprises a shielded X-ray chamber in which samples are tested and which affixes to the XRF analyzer's window via a spring loaded handle, a stabilizing base to which the analyzer's handle is situated, and a stanchion for horizontal mounting of the XRF analyzer. In the horizontal orientation, the chamber contains an adjustable platform and soil sample retainer to facilitate the positioning of the sample to be tested. The stanchion can be stored under the base.

Abstract: A non-destructive testing and inspection (NDT/NDI) system and method operable to conduct an ultrasonic scanning test on a test object that synchronizes and merges the apertures of two or more NDT sub-instruments in frequency and phase. Disclosed are a method of using a Phased Lock Loop (PLL) as a synchronizing clock/trigger generator, and also a method of using a General Positioning Clock (GPS) and a pulse per second (PPS) output. Both methods combine ultrasonic scanning data acquisition from two or more NDT sub-instruments, and transform the sub-instruments into one bigger NDT instrument.

Abstract: Disclosed is a sample handling assembly facilitating a sample holding cell used for XRD analysis. The assembly holds the sample cell upright during sample loading and analysis phases. The sample handling assembly is vibrated, partly by a tuning fork, to allow the powder to flow into the sample cell. After the XRD analysis, a rotating arm holding the sample cell is rotated 180° to orient the sample cell completely upside down so that the sample can be emptied. Also disclosed are jets of air that are pulsed onto the sample cell, and/or into the sample cell funnel-tube assembly, to shake and clean the components.

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.

Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.

Abstract: An adjustable probe holder assembly is disclosed for an inspection or measurement sensor, such as an ultrasound transducer, eddy current sensor, magnetic thickness sensor or optical image sensor, in order to position the sensor in a confined space using an extended arm with an adjustable curvature. The probe holder has at least two elongated holding arms, among which a first arm and a second arm, each having a probe end and a holding end, wherein the probe end of each of the holding arms are attached to the probe and the at least two arms remain substantially parallel and very close to each other when the probe holder is at a non-operational status. The two arms bulge open away from each other due to either a tension force or a compression force being exerted along the longitudinal direction of either one of the arms, holding the probe to be against the test surface of the test object.

Abstract: Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the sample's atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.

Abstract: Disclosed is a composite focusing wedge for ultrasonic non-destructive testing/inspection. The composite wedge comprises a base made of machined or cast material, and a lens made of a material which is cast in liquid form and subsequently solidifies. The acoustic velocity in the base material is less than that in the lens material. The castable lens material conforms exactly to a convex machined or cast surface of the base, thereby forming a concave lower surface of the lens. A flat ultrasonic probe is coupled to a planar upper surface of the lens. The minimum distance between the lower concave and upper planar surfaces of the lens is less than one acoustic wavelength in the lens material. The ringdown time of reverberations between the two surfaces is then sufficiently short that there is no interference between the reverberations and signals from sub-surface flaws in the object being tested.

Abstract: Disclosed is a probe holder for in-line inspection of the surface of bars of high value alloys. To attain full coverage of the inspected surface, the bar is rotated while either the bar or the probe holder is translated. The probe holder of the invention ensures constant probe lift-off by allowing the probe to move freely under its own weight, while constraining the motion to be only in the radial direction of the bar. The lift-off distance is defined by a spacer which is made of soft material to avoid damaging the inspected surface. Although the spacer is soft, its wear due to friction with the rotating bar is minimized by minimizing the pressure between the spacer and the bar. This is achieved by resting most of the mechanism weight on two rollers, with only the much smaller weight of the probe resting on the spacer.

Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.

Abstract: The phased-array probe to be received on a probe receiving area of a wedge generally has a probe housing, a plurality of acoustic transducer elements disposed in the probe housing and distributed along a length of a working surface of the probe housing, and a matching layer covering the plurality of acoustic transducer elements and extending to cover an extended region of the working surface of the probe housing such that the matching layer forms a closed contact with an upper end of an acoustic damping junction of the wedge when the working surface of the probe housing of the phased-array probe is received on the probe receiving area of the wedge, wherein the closed contact prevents acoustic energy from being reflected from the extended region of the working surface of the probe housing.

Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.

Abstract: Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.

Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.

Abstract: Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.

Abstract: An adjustable probe holder assembly is disclosed for an inspection or measurement sensor, such as an ultrasound transducer, eddy current sensor, magnetic thickness sensor or optical image sensor, in order to position the sensor in a confined space using an extended arm with an adjustable curvature. The probe holder has at least two elongated holding arms, among which a first arm and a second arm, each having a probe end and a holding end, wherein the probe end of each of the holding arms are attached to the probe and the at least two arms remain substantially parallel and very close to each other when the probe holder is at a non-operational status. The two arms bulge open away from each other due to either a tension force or a compression force being exerted along the longitudinal direction of either one of the arms, holding the probe to be against the test surface of the test object.

Abstract: Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.