Abstract: Image quality is assessed for a digital image that is a composite of tiles or other image segments, especially focus accuracy for a microscopic pathology sample. An algorithm or combination of algorithms correlated to image quality is applied to pixel data at margins where adjacent image segments overlap and thus contain the same content in separately acquired images. The margins may be edges merged to join the image segments smoothly into a composite image, and typically occur on four sides of the image segments. The two versions of the same image content at each margin are processed by the quality algorithm, producing two assessment values. A sign and difference value are compared with other image segments, including by subsets selected for the orientation of the margins on sides on the image segments. The differences are mapped to displays. Selection criteria determine segments to be re-acquired.
Type:
Application
Filed:
April 8, 2010
Publication date:
October 13, 2011
Applicants:
General Electric Company, Omnyx LLC
Inventors:
David L. Henderson, Kevin B. Kenny, Dirk R. Padfield, Dashan Gao, Richard R. McKay, Vipul A. Baxi, Robert J. Filkins, Michael C. Montalto
Abstract: A digital pathology system has a central workflow server hosting digital pathology application services and supporting one or more pathology workstations. The digital pathology system may include one or more image servers, providing digital images of sample specimen slides that are associated with medical cases. Residing at and executing on each pathology workstation is a digital pathology application client, which is the counterpart of digital pathology application services at the central workflow server. The combination of digital pathology application services at the central workflow server and digital pathology application client at each pathology workstation support a pathology workflow software module and a slide viewer software module. The present disclosure also describes a method of operation and/or use of the digital pathology system.
Type:
Application
Filed:
September 4, 2009
Publication date:
March 10, 2011
Applicant:
Omnyx LLC
Inventors:
Joshua Todd Ehlke, Narasimha Rao Khandavilli, Timothy Mark McVaugh, Anthony J. Melanson, Steve Selzer, Curtis Stratman, Marina Virnik, Joshua Micah Weihnacht, Zhen Zeng