Patents Assigned to Ophir Optronics Ltd.
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Publication number: 20120134386Abstract: A laser power meter incorporating an absorber disc with a peripheral thermopile ring, either continuous or segmented, and an additional temperature detection element in the central portion, that enables measurement of beam size. This detection element can be a thermopile element, generally a ring of smaller diameter than the peripheral thermopile used, and located closer to the center of the absorber disc. With this arrangement the beam size can be measured, in addition to measurements of the power and the position of the beam. Alternatively, this centralized detection element can be a single thermocouple junction located at the center of the disc, which acts as the hot junction of a thermocouple pair. The second or cold junction is effectively located on the disc close to the peripheral thermopile. Alternatively, two temperature measuring elements can be used, one at the disc center and one at the periphery.Type: ApplicationFiled: June 10, 2010Publication date: May 31, 2012Applicant: OPHIR OPTRONICS LTD.Inventors: Eliyahu Bender, Shimon Elstein, Mark Ivker
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Publication number: 20120068420Abstract: A method for centering a circular optical element using a non-self-centering chuck adapted to grip the element at two grip strengths. The element is rotated in the chuck while measuring the lateral position of the element's outer rim with a probe. The positions of maximum and minimum run-out of the element as a function of its angular position are determined. Chuck rotation is stopped at an angular position with the maximum rim run-out positioned at a predetermined point. The grip of the chuck is reduced such that the element is still held in the chuck but can be moved in a lateral direction without damaging its surface. The element is moved in a direction connecting the predetermined point of maximum run-out and the axis of rotation of the chuck, in order to reduce the run-out of the element. The procedure is repeated until the desired centering is achieved.Type: ApplicationFiled: November 28, 2011Publication date: March 22, 2012Applicant: OPHIR OPTRONICS LTD.Inventors: Baruch Ben-Menachem, Mordechai Gilo
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Patent number: 7154077Abstract: Devices and methods for measurement of energy from a defined source having increased accuracy in measuring low energies. The device comprises a housing containing sensors. A first sensor receives energy from the source and produces a first output. A second sensor receives ambient energy only and produces a second output. Subtraction of the second output from the first output produces a more accurate corrected output. The method includes providing a housing containing a first sensor and a second sensor and directing energy from the defined source to a surface of the first sensor thereby causing the first sensor to produce a first output while only ambient energy from sources other than the defined source is applied to a surface of the second sensor which produce a second output that is subtracted from the first output producing a corrected output.Type: GrantFiled: October 25, 2004Date of Patent: December 26, 2006Assignee: Ophir Optronics Ltd.Inventors: Efraim Miklatzky, Ephraim Greenfield
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Patent number: 6622599Abstract: A precision optical element is described, such as is used in thermal imaging systems in the infrared, manufactured by means of single point machining, with both of its surfaces having an aspheric form, with or without the addition of a diffractive optics pattern. The element is produced while held in a novel vacuum chuck, whose support surface has a width in the radial direction significantly less than the size of the element, and which is aspherically machined to match the aspheric first surface of the element. A method whereby such an element can be produced by means of single point machining, such as diamond turning or fly cutting, is also described. Also described are new optical system designs and applications using such double-sided aspheric elements, thereby providing significant improvement over currently available optical systems.Type: GrantFiled: May 20, 1999Date of Patent: September 23, 2003Assignee: Ophir Optronics Ltd.Inventors: Baruch Ben-Menachem, Yaacov Zerem, Nissim Asida
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Patent number: 6460437Abstract: A precision optical element is described, such as is used in thermal imaging systems in the infra-red, manufactured by means of single point machining, with both of its surfaces having an aspheric form, with or without the addition of a diffractive optics pattern. The element is produced while held in a novel vacuum chuck, whose support surface has a width in the radial direction significantly less than the size of the element, and which is aspherically machined to match the aspheric first surface of the element. A method whereby such an element can be produced-by-means of single point machining, such as diamond turning or fly cutting, is also described. Also described are new optical system designs and applications using such double-sided aspheric elements, thereby providing significant improvement over currently available optical systems.Type: GrantFiled: June 11, 2001Date of Patent: October 8, 2002Assignee: Ophir Optronics Ltd.Inventors: Baruch Ben-Menachem, Yaacov Zerem, Nissim Asida
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Publication number: 20010048526Abstract: A dispersive spectrometer whose dispersive element is aligned such that the direction of dispersion is essentially perpendicular to the collimating plane, which is the plane of the input beam path between the centers of the input slit, the collimating mirror and the dispersive element. As a result of this construction, the lateral spread over which the beam path traverses is reduced, since use is also made of the direction perpendicular to the input beam path plane for the dispersive spread of the beam, and the spectrometer is thus of compact construction.Type: ApplicationFiled: May 7, 2001Publication date: December 6, 2001Applicant: Ophir Optronics Ltd.Inventor: Eliyahu Bender
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Patent number: 5953165Abstract: An optical aiming device including two optical elements, each characterized by a refractive index and a critical angle defining a total internal reflection plane, positioned one in front of the other substantially along an aiming axis, each optical element causing a portion of light impinging thereon at an angle greater than the critical angle, to be reflected, thereby defining a demarcation between a region of reflected light and non-reflected light, the optical elements being oriented such that the demarcations of each optical element intersect at a point lying substantially along the aiming axis.Type: GrantFiled: March 17, 1998Date of Patent: September 14, 1999Assignee: Ophir Optronics Ltd.Inventor: Evgeny Stolov
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Patent number: 5376783Abstract: A technique for performing background suppression in photodiode detectors is disclosed. A first detector measures the light emitted by the source to be measured and the background light, while a second detector simultaneously measures the background light only. The value measured by the second detector is subtracted from the value measured by the first detector, and the difference represents the portion of the first detector's measured value which is attributable to the source to be measured.Type: GrantFiled: April 24, 1994Date of Patent: December 27, 1994Assignee: Ophir Optronics Ltd.Inventors: Jacob J. Vecht, Ben-Zion Halperin, Ephraim Greenfield
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Patent number: 5357111Abstract: Pyroelectric detection apparatus including a pyroelectric detector operative to produce an electric output in response to pulsed incident radiation and a discharge circuit for discharging the electric output. The discharge is operative to impose an effective high impedance on the pyroelectric detector during at least a portion of the duration of each radiation pulse and to impose a low effective resistance during the intervals between the radiation pulses.Type: GrantFiled: August 17, 1993Date of Patent: October 18, 1994Assignee: Ophir Optronics Ltd.Inventor: Jacob J. Vecht