Patents Assigned to Optical Semiconductors, Inc.
  • Scintillation solid and method of measuring radiation
    Patent number: 5500147
    Abstract: A monolithic solid scintillation body with a monocrystalline or polycrystalline morphology having generally constant luminescence from about 25.degree. C. to at least about 200.degree. C. and average crystal domain grain diameters of at least about 5 millimeters and being composed of zinc sulfide doped with copper and a method of measuring radiation using the scintillation body and an apparatus for measuring radiation are disclosed.
    Type: Grant
    Filed: October 27, 1992
    Date of Patent: March 19, 1996
    Assignee: Optical Semiconductors, Inc.
    Inventor: Brian J. Fitzpatrick
  • Method and apparatus for measuring incident radiation
    Patent number: 5493121
    Abstract: A method and apparatus for measuring radiation are disclosed in which a scintillation body intercepts incident radiation to cause the body to emit a population of scintillation photons, the population of scintillation photons is spectrally decomposed into at least a first subpopulation of photons and a second subpopulation of photons (the first subpopulation originating from faster time decay processes than the second subpopulation) and at least one of the subpopulations is detected.
    Type: Grant
    Filed: November 30, 1992
    Date of Patent: February 20, 1996
    Assignee: Optical Semiconductors, Inc.
    Inventor: Brian J. Fitzpatrick