Patents Assigned to OPTOPROFILER LLC
  • Measurement of thickness and topography of a slab of materials
    Patent number: 11226190
    Abstract: We describe apparatus for measurement of thickness and topography of slabs of materials employing probes with filters using polarization maintaining fibers.
    Type: Grant
    Filed: April 7, 2020
    Date of Patent: January 18, 2022
    Assignee: OPTOPROFILER LLC
    Inventor: Wojciech Jan Walecki