Patents Assigned to Orbital Instruments Limited
  • Patent number: 8387161
    Abstract: An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.
    Type: Grant
    Filed: March 12, 2009
    Date of Patent: February 26, 2013
    Assignee: Orbital Instruments Limited
    Inventors: Martin F. Finlan, Shelley J. Wilkins