Abstract: Methods for optimizing the cost of executing a set of tests including finding the optimal ordering of the tests for some important cases such as set of tests having series-parallel structure with no statistical dependencies, and near-optimal orderings for the rest of the cases, such that the resources required for executing the tests are minimized.
Type:
Grant
Filed:
September 3, 2008
Date of Patent:
May 8, 2012
Assignees:
Orbotech, Ben Gurion University
Inventors:
Eyal Shlomo Shimony, Ronen Brafman, Daniel Berend, Shimon Cohen
Abstract: Methods for optimizing the cost of executing a set of tests including finding the optimal ordering of the tests for some important cases such as set of tests having series-parallel structure with no statistical dependencies, and near-optimal orderings for the rest of the cases, such that the resources required for executing the tests are minimized.
Type:
Application
Filed:
September 3, 2008
Publication date:
August 25, 2011
Applicants:
Ben Gurion University of the Negev Research and Development Authority, Orbotech
Inventors:
Eyal Shlomo Shimony, Ronen Brafman, Daniel Berend, Shimon Cohen
Abstract: A verification and repair station for examining a printed circuit board (PCB) at a plurality of predetermined co-ordinates thereon for enabling an operator to classify suspected faults and to effect manual repair thereof if necessary. A worktable is provided for securing thereon the PCB in precise registration with an origin of the worktable and a fixed camera produces a magnified image of an illuminated area of the PCB. The co-ordinates are stored in a memory of a computer whilst a translatory drive is coupled to the worktable and to the computer for moving the worktable under control of the computer through mutually orthogonal axes so that successive co-ordinates are aligned with the camera.