Abstract: An examination diagnosis device includes a probe, a stress detector and a grip. The probe has an elongated portion and a tip portion, and the tip portion is provided to be bent at one end of the elongated portion. The stress detector is configured to be able to detect a force in an X direction, a force in a Y direction and a force in a Z direction applied to the tip portion of the probe. The tip portion of the probe may be bent in a plane parallel to the X direction and the Z direction. A user allows the tip portion of the probe to come into contact with a joint portion that is a subject of examination and diagnosis while gripping the grip.