Abstract: Techniques for a logic analyzer instrument that permit the acquisition of digital samples from a plurality of logic signals in a large mainframe computer, or other system under test, in a manner that the signals can be reconstructed for viewing and analysis of the relationship between them. Edges of the signals are located, during their reconstruction, with many times higher resolution than that of the sampling clock. A plurality of sample records, asynchronously timed, are taken of the logic signals from the system under test, and the samples are combined in a way that locates logic signal edges with precision.