Patents Assigned to Oxford Diffraction Limited
  • Publication number: 20070140421
    Abstract: There is provided a method and apparatus for assessing in-situ crystal formation in a test sample. Both optical imaging and X-ray diffraction techniques are utilized, with the results of these processes being combined in such a way as to produce an overall score relating to the aptness of crystalline material for harvesting and subsequent X-ray crystallography.
    Type: Application
    Filed: December 13, 2006
    Publication date: June 21, 2007
    Inventors: Damian Kucharczyk, Richard Cooper, Paul Loeffen
  • Patent number: 7158608
    Abstract: An x-ray diffraction apparatus comprises an x-ray source for generating an x-ray beam, a monochromator for generating a monochromatic x-ray beam from the x-ray beam, and a collimator for collimating the monochromatic x-ray beam and directing it onto a sample, wherein the x-ray source and the monochromator are pre-assembled and fixed with respect to each other in an integrated unit such that in use the path length of the x-ray beam from the source to the monochromator is maintained substantially constant. X-ray flux at the sample is further enhanced by use of a partial monocapillary collimator arranged to direct part of the X-ray beam to the sample by a single grazing reflection.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: January 2, 2007
    Assignee: Oxford Diffraction Limited
    Inventor: Damian Kucharczyk