Abstract: A microcircuit testing device, comprising an element for supporting a plurality of probes which are meant to make contact with pads of microcircuits to be tested which are formed on a wafer, the probes being directed substantially vertically to the supporting element, and connection elements suitable to connect ends of the probes, which are arranged opposite to ends for contact with the pads, to an element for providing an electrical interface between the connection elements and electric connector elements.
Type:
Grant
Filed:
November 30, 1998
Date of Patent:
March 6, 2001
Assignee:
Padar Technologie di Riccioni Roberto S.a.s.