Abstract: An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit that is coupled to the lowering control unit and that controls the lowering control unit to rotate the inspection equipment at a predetermined angle in left and right directions when viewed from a frontal point of view, and a forward and backward control unit that is disposed above the rotation control unit and that transmit a moving force to the rotation control unit to move the inspection equipment forward or forward on the inspected object.
Type:
Grant
Filed:
December 18, 2022
Date of Patent:
March 25, 2025
Assignee:
PAMTEK Co., Ltd.
Inventors:
Jae Woong Kim, Jung In Park, Sung Gu Kim, Hee Tae Kim
Abstract: A camera module inspection system and a method for operating the inspection system. More specifically, the inspection system can quickly check and correct the alignment of the camera module.
Type:
Grant
Filed:
December 18, 2022
Date of Patent:
July 9, 2024
Assignee:
PAMTEK CO., LTD.
Inventors:
Jae Woong Kim, Jung In Park, Hyun Wook Shin, Kyung Sub Oh