Patents Assigned to Panalytique Inc.
  • Patent number: 8239171
    Abstract: The invention provides a system and a method of eliminating interference for impurities measurement in noble gases based on emission spectroscopy which provide very stable, sensitive and interference free results. The method mainly relies on the use of a combination of particularly designed means serially connected for cancelling interferences and proper means for correcting linearity issues. The proposed method is particularly advantageous since it offers long-term stability while providing very accurate and reliable results, even at sub-ppb and up to 10,000 ppm levels, whatever the surrounding conditions and the additional impurities that could be present in the gas under analysis.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: August 7, 2012
    Assignee: Panalytique Inc.
    Inventors: Yves Gamache, André Fortier
  • Patent number: 7824471
    Abstract: The present invention provides a chromatographic method for eliminating interference from interfering agents, coming from the gas sample itself or from the system material used to perform the impurities measurements, on impurities to be quantified in a gas sample. The method advantageously relies on the use of an additional valve and an additional sample loop particularly arranged in a G. C. system, and also on an additional supporting gas inlet operatively connected to the system through the additional sample loop for providing the system with a supporting gas comprising at least a predetermined portion of a predetermined active gas that will react with the unwanted interfering impurities, if any, or with the column material to cancel out unwanted active sites. Thus, the method of the present invention can advantageously be used in gas chromatographic systems to improve sensitivity thereof by acting on column separation material.
    Type: Grant
    Filed: March 10, 2006
    Date of Patent: November 2, 2010
    Assignee: Panalytique Inc.
    Inventors: Yves Gamache, Andre Fortier
  • Publication number: 20090132206
    Abstract: The invention provides a system and a method of eliminating interference for impurities measurement in noble gases based on emission spectroscopy which provide very stable, sensitive and interference free results. The method mainly relies on the use of a combination of particularly designed means serially connected for cancelling interferences and proper means for correcting linearity issues. The proposed method is particularly advantageous since it offers long-term stability while providing very accurate and reliable results, even at sub-ppb and up to 10,000 ppm levels, whatever the surrounding conditions and the additional impurities that could be present in the gas under analysis.
    Type: Application
    Filed: February 28, 2007
    Publication date: May 21, 2009
    Applicant: PANALYTIQUE INC.
    Inventors: Yves Gamache, Andre Fortier