Patents Assigned to Panex, Inc.
  • Patent number: 4091683
    Abstract: A measuring system based on using a ratio of variable capacitance measurements derived from alternate sampling and referencing of at least two capacitance devices and use of a single channel for the capacitance outputs so that the measurements are basically independent of the circuit components, supply voltage, temperature drift problems. The measurements can be high resolution digital signals.
    Type: Grant
    Filed: September 27, 1976
    Date of Patent: May 30, 1978
    Assignee: Panex, Inc.
    Inventor: Leroy C. Delatorre