Patents Assigned to Particle Measuring Systems, Inc.
  • Patent number: 5751422
    Abstract: A resonant optical cavity having a laser medium therein is positioned within a specific environment, such as a process and/or harsh environment, and a sensing region, also within the resonant optical cavity, receives light whereby particles at the sensing region affect, as by scattering, light at the sensing region. The affected light is optically collected within the specific environment and optically coupled to a processor outside the specific environment where an output is provided that is indicative of particles detected at the sensing region, including small particles having a size at least as small as about 0.05 to 10 microns. With a solid state laser medium utilized within the resonant optical cavity, the solid state laser medium is pumped by an actuator, such as a semiconductor diode laser, providing a light output that is optically coupled to the solid state laser medium.
    Type: Grant
    Filed: February 26, 1996
    Date of Patent: May 12, 1998
    Assignee: Particle Measuring Systems, Inc.
    Inventor: John R. Mitchell
  • Patent number: 5671046
    Abstract: Device and method are disclosed for optically detecting particles in a free (i.e., unenclosed) stream of liquid. The free liquid stream is produced by ejecting liquid under pressure from a nozzle so that the stream has a smooth round surface. A laser beam intersects the free liquid stream and light scattered by particles in the free liquid stream is collected and processed to provide an output indicative of size and/or number of particles causing the light to be scattered. The free liquid stream is preferably directed vertically downward, and the laser beam and light collector are angularly positioned with respect to the free liquid stream and one another with the light collector collecting scattered light at the intersection of the light beam and the free liquid stream.
    Type: Grant
    Filed: July 1, 1996
    Date of Patent: September 23, 1997
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Dennis J. Knowlton
  • Patent number: 5493123
    Abstract: System and method are disclosed for inspecting objects, such as sheets of flat panel glass, to detect flaws or contamination at a surface. The surface to be inspected is illuminated with 253.7 nm ultraviolet (UV) radiation to assure detection of defects only at the front surface subjected to the radiation. UV radiation reaching the front surface is scattered by defects at the front surface, and scattered UV radiation is collected by a UV dark field imaging system and directed by the imaging system to a detecting unit, preferably including a charge coupled device (CCD). The detecting unit senses UV radiation scattered at the surface due to defects within a selected size range and provides an output to a processing unit providing an output indicative of the defects sensed within the selected size range.
    Type: Grant
    Filed: April 28, 1994
    Date of Patent: February 20, 1996
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Robert G. Knollenberg, Vaughn C. Hoxie, Clinton E. Utter
  • Patent number: 5459569
    Abstract: A modular particle detecting device is disclosed for nonintrusive in-situ detection of particles passing through a sensing region. The device is particularly useful for microcontamination control in semiconductor processing environments, and includes, as separate components, a viewing unit and a sensing unit. The viewing unit has a detecting window and heated illuminating and discharge windows for condensation control. A fluid passage connectable to a flow line enables particle-carrying fluid to pass through a sensing region within the passage. The sensing unit has illuminating circuitry for providing light through the illuminating window to the sensing region, and has detecting circuitry to receive, through the detecting window, light scattered at the sensing region to thereby detect particles in fluid then at the sensing region without physical intrusion of the sensing unit into the sensing region.
    Type: Grant
    Filed: April 21, 1993
    Date of Patent: October 17, 1995
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Scott C. Knollenberg, Robert G. Knollenberg
  • Patent number: 5282151
    Abstract: Submicron diameter particle detection utilizing a high density array is disclosed. The high density array, such as a charge coupled device, is utilized to detect light scattered at a sensing region by particles illuminated by a light source, such as a laser source. Charge storage is utilized to buffer each data frame transferred from the high density array and the multiple serial outputs are processed by parallel processing that includes threshold detection and analog-to-digital converting. A micro-computer and associated digital storage receives the digital outputs and provides outputs indicative of submicron particle sizing.
    Type: Grant
    Filed: February 28, 1991
    Date of Patent: January 25, 1994
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4893932
    Abstract: A surface analysis system and method are disclosed for determining particle contamination and/or defects on or below a surface of material. Laser beams having different polarizations are directed to the surface to be analyzed and light scattered from particle contamination and/or defects on or below the surface is collected and detected to provide electrical signals representative thereof. The electrical signals are then processed to provide an output indicative of sensed contamination and/or defects. In the embodiment particularly shown and described, a pair of polarized laser beams, one of which is a "P" polarized laser beam and the other of which is a "S" polarized laser beam, are separately directed to a monitoring region so that the beams impinge at a common point on the surface to be analyzed.
    Type: Grant
    Filed: October 21, 1988
    Date of Patent: January 16, 1990
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4893928
    Abstract: A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region illuminated by a laser beam and receiving the particles in a medium, such as air. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times.
    Type: Grant
    Filed: September 13, 1988
    Date of Patent: January 16, 1990
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4798465
    Abstract: A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region receiving the particles in a gas carrier, such as air, and a laser beam to illuminate the sensing region. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times. High molecular scattering is generated whenever the gas volume being viewed is large as is required for high flow rates, high molecular density (high pressures), or large gas molecules.
    Type: Grant
    Filed: April 14, 1986
    Date of Patent: January 17, 1989
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4740988
    Abstract: A laser device is disclosed having mirror heating to enhance performance of the device by minimizing induced light absorption to thereby improve mirror quality. The mirrors of a laser device are commonly made of a substrate having a coating thereon formed by alternating layers of high and low refractive index materials, normally classified as refractory oxide materials, which materials are susceptible to formation therein of color centers, such as formation of F-centers when exposed to ultraviolet light, which color centers reduce mirror quality due to induced light absorption losses. By heating the mirror, the F-centers are substantially eliminated to thereby improve mirror quality and enhance the longevity of the laser device.
    Type: Grant
    Filed: November 12, 1986
    Date of Patent: April 26, 1988
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Robert G. Knollenberg, Ramin Lalezari, Kenneth R. Sample
  • Patent number: 4728190
    Abstract: A device and method are disclosed for optically detecting particles in a fluid. A fluid passage with transparent walls defining a monitoring volume, or region, is provided, and particles in the fluid are optically detected by directing a laser beam through the fluid in the monitoring region and collecting light scattered by the particles. A capillary is utilized as the fluid passage, and reflections from the walls of the capillary are effectively precluded. The laser beam is directed through the capillary by means of a window at the entrance side and a lens at the collecting side with the air-glass interfaces being outside the depth of view of particle monitoring within the monitoring region. As a result of this arrangement, the amount of scattered light is greatly reduced and a more uniform light signal is achieved which results in better size resolution of particles than has heretofore been achieved.
    Type: Grant
    Filed: October 15, 1985
    Date of Patent: March 1, 1988
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4636075
    Abstract: Particle measurement is disclosed utilizing orthogonally polarized components of a laser beam. A laser beam is split into orthogonally polarized components and at least one of the components is thereafter beam shaped to have a modified dimension. The components are then recombined and focused to provide a beam combination that is directed through a particle containing volume where scattering of the components occurs by the particles. With the components superimposed upon one another, a localized volume is created with one beam being contracted to a smaller volume than the other beam with the illumination intensity ratios thereat being either greater or less than unity depending upon the optics selected.
    Type: Grant
    Filed: August 22, 1984
    Date of Patent: January 13, 1987
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4594715
    Abstract: A laser having a stabilized external passive cavity is disclosed, with stabilization being effected by modulation of an external mirror positioned along the laser axis. The laser system includes first, second and third spaced mirrors with the second mirror being an output coupler positioned between the first and third mirrors so that an active cavity is defined between the first and second mirrors and a passive cavity is defined between the second and third mirrors. The active cavity feeds, or pumps, the passive cavity which is stabilized by modulation of the third mirror by movement along the laser axis by linear oscillation to Doppler shift the reflected waves within the passive cavity and thereby produce frequencies that do not interfere with the stable modes of the active cavity.
    Type: Grant
    Filed: November 17, 1983
    Date of Patent: June 10, 1986
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4571079
    Abstract: An aerosol sampling device and method are disclosed having improved sample flow characteristics. Sample flowing through an inlet nozzle is heated prior to discharge from the nozzle toward a measurement area to maintain sample flow more nearly laminar by compensating for the adiabatic cooling that occurs due to acceleration of flow through the nozzle. In addition, heating of the sample flow prevents condensation which can result with ambient air having a relative humidity of fifty percent. An optical particle measuring apparatus is shown having a generator for providing a laser beam, the path of which is through a measurement area, and an inlet nozzle through which aerosol sample is injected into the measurement area, after heating in accordance with this invention, to allow operation of the laser at a relatively high Q by reducing non-laminar flow characteristics.
    Type: Grant
    Filed: December 29, 1983
    Date of Patent: February 18, 1986
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4027162
    Abstract: Method and apparatus for orienting and measuring fibrous particles by conducting longitudinally oriented fibrous particles through a beam of radiation and measuring the radiation scattered in a direction aligned with the length of such particle and, independently, also measuring the amount of radiation scattered transverse to the length of the particle. Preferably, the measurements are accomplished utilizing a sensor having an inactive center portion substantially corresponding to the area of undisturbed beam of radiation, a first photosensitive area in a portion of the sensor aligned with the length of the particles, and a second, independent photosensitive area transverse to the length of the particle. Signals generated by the two photosensitive areas are added to determine the size of the particles, and the ratio between the signals is established to determine the aspect ratio of the particle.
    Type: Grant
    Filed: April 26, 1976
    Date of Patent: May 31, 1977
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Robert G. Knollenberg
  • Patent number: 4011459
    Abstract: Method and apparatus for establishing a valid sample volume in a beam of radiation, wherein a sample stream is introduced substantially transversely to the radiation beam, an optical system is configured to produce images on first and second image planes, the two planes preferably being perpendicular to one another and established by means of a beam splitter, first and second photosensors being positioned in the image planes, the first photosensor having greater optical and an electronic gain and a masked portion, and the second photosensor being either unmasked or having masked portions corresponding generally to the unmasked portions of the first photosensor, the first photosensor being connected to comparator means and the second photosensor also being connected to the comparator means which accepts data only when the signal from second photosensor is of a greater magnitude than the signal from the first photosensor, whereby images on the photosensors from points outside the selected sample volume will be
    Type: Grant
    Filed: December 5, 1975
    Date of Patent: March 8, 1977
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Robert George Knollenberg, Robert E. Luehr
  • Patent number: 3941982
    Abstract: Two-dimensional data may be acquired at extremely high rates by means of a linear sensor array, and ganged shift registers with each sensor associated with at least one shift register. The state of each sensor is sampled periodically in accord with a selected, relatively high clock frequency and each sampling is sequentially recorded in the shift register associated with a specific sensor. A first dimension is provided by the linear nature of the sensor array and the second dimension is supplied by the sampling clock frequency as a subject moves past the sensor array. In a more advanced embodiment, the sampling operates only during the occurrence of an event and data is cyclically recorded in one group of shift registers at a rapid rate while previous data is unloaded from an alternative group of shift registers at a conventional rate.
    Type: Grant
    Filed: July 22, 1974
    Date of Patent: March 2, 1976
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Robert George Knollenberg, Albury John Dascher