Patents Assigned to Particle Measuring Systems
  • Patent number: 10345200
    Abstract: The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.
    Type: Grant
    Filed: July 23, 2014
    Date of Patent: July 9, 2019
    Assignees: PARTICLE MEASURING SYSTEMS, S.R.L., PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Giovanni Scialo, Ronald W. Adkins, Davide Recchia
  • Patent number: 10197487
    Abstract: The systems and methods provided herein relate generally to the prevention of migration of condensate in a condensation particle counter between components designed to handle condensate (e.g. saturator, condenser, condensate reservoir) and components which may be damaged by the condensate (e.g. detection and flow control devices).
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: February 5, 2019
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Brian Knollenberg, Stephen Pavone, Cliff Ketcham, Rebecca Thompson
  • Patent number: 9989462
    Abstract: This invention relates to optical particle counters and methods capable of effectively distinguishing signals generated from particle light scattering from sources of noise. Embodiments of the invention, for example, use multisensory detector configurations for identifying and distinguishing signals corresponding to fluctuations in laser intensity from signals corresponding to particle light scattering for the detection and characterization of submicron particles. In an embodiment, for example, methods and systems of the invention compare signals from different detector elements of a detector array to identify and characterize noise events, such as noise generated from laser intensity instability, thereby allow for the detection and characterization of smaller particles. The system and methods of the present invention, thus, provide an effective means of reducing false positives caused by noise or interference while allowing for very sensitive particle detection.
    Type: Grant
    Filed: April 1, 2016
    Date of Patent: June 5, 2018
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: James Lumpkin, Matthew Melton
  • Patent number: 9885640
    Abstract: Provided are impactors for detecting biologics having an adjustable separation distance between an impact surface and the intake aperture, including the exit of the intake aperture. The impactor has a sampling head having at least one intake aperture and an exit, an impactor base comprising an impact surface, wherein the impact surface opposibly faces the sampling head exit and is separated from the exit by a separation distance. The separation distance is continuously adjustable between a minimum separation distance and a maximum separation distance and can accommodate impact surfaces having different heights by positioning the impact surface, irrespective of height of the impact surface, at an optimal separation distance from the sample intake aperture, such as by a rotation-type mechanism with a change in distance indication provided to a user by a separation distance step indicator.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: February 6, 2018
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Cliff Ketcham, Paul B. Hartigan, Chandrasekar Lakshmanan
  • Patent number: 9810558
    Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: November 7, 2017
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: Thomas Bates, Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
  • Patent number: 9808760
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: June 6, 2017
    Date of Patent: November 7, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Patent number: 9682345
    Abstract: This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: June 20, 2017
    Assignees: PARTICLE MEASURING SYSTEMS, INC., PARTICLE MEASURING SYSTEMS, S.R.L.
    Inventors: Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. Knollenberg, Daniel Rodier
  • Patent number: 9638665
    Abstract: The invention provides a method for obtaining aerosol particle size distributions with a scanning mobility particle sizer (SMPS) device comprising a differential mobility analyzer (DMA); which method comprises the stages: (i) collecting a first data set of particle concentrations vs. size for a size range from a predetermined minimal size Dmin to an intermediate size Dt by varying a voltage applied to a DMA column of an SMPS from Vmin to Vt1 at a first sheath flow rate Qsh1; (ii) changing the sheath flow rate from the first sheath flow rate Qsh1 to a second sheath flow rate Qsh2; (iii) collecting a second data set of particle concentrations vs.
    Type: Grant
    Filed: June 17, 2014
    Date of Patent: May 2, 2017
    Assignee: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Boris Zachar Gorbunov
  • Patent number: 9631222
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: April 25, 2017
    Assignee: Particle Measuring Systems, Inc.
    Inventors: Cliff Ketcham, Paul B. Hartigan, Ronald W. Adkins
  • Publication number: 20160370320
    Abstract: The invention provides a method for obtaining aerosol particle size distributions with a scanning mobility particle sizer (SMPS) device comprising a differential mobility analyzer (DMA); which method comprises the stages: (i) collecting a first data set of particle concentrations vs. size for a size range from a predetermined minimal size Dmin to an intermediate size Dt by varying a voltage applied to a DMA column of an SMPS from Vmin to Vt1 at a first sheath flow rate Qsh1; (ii) changing the sheath flow rate from the first sheath flow rate Qsh1 to a second sheath flow rate Qsh2; (iii) collecting a second data set of particle concentrations vs.
    Type: Application
    Filed: June 17, 2014
    Publication date: December 22, 2016
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Boris Zachar GORBUNOV
  • Publication number: 20160139013
    Abstract: The invention provides an apparatus set up for diluting aerosols; the apparatus comprising: (i) a dilution chamber (1); (ii) an aerosol inlet (2) on one side of the dilution chamber for admitting an aerosol into the dilution chamber; (iii) an aerosol outlet (3) on the same or another side of the dilution chamber through which diluted aerosol particles can leave the dilution chamber; (iv) a diluent gas inlet (4) for admitting into the chamber a diluent gas; (v) a diluent gas outlet (5) through which diluent gas can leave the dilution chamber; (vi) a gas flow maintenance system (6) that provides circulation of the diluent gas through the dilution chamber; and (vii) means for determining the extent of dilution of the aerosol leaving the aerosol outlet. The invention also provides methods of diluting and counting aerosol particles using the apparatus of the invention.
    Type: Application
    Filed: June 20, 2014
    Publication date: May 19, 2016
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Boris Zachar GORBUNOV
  • Publication number: 20160126081
    Abstract: The invention provides an apparatus for charging or altering the charge of gas-entrained particles in an aerosol, the apparatus comprising: (a) an ion generating chamber (1) containing a first electrode (2) for generating a corona discharge, the first electrode (2) being connected to a power supply of sufficiently high voltage to create the corona discharge; the ion generating chamber (1) having an ion outlet (10) through which ions generated by the corona discharge can leave the chamber (1); (b) a particle charging chamber (5) in which charging or altering the charge of gas-entrained particles in an aerosol takes place, the particle charging chamber (5) being in fluid communication with the ion generation chamber (1) and having an inlet and an aerosol outlet; and (c) an electrically non-conductive interface body (7) positioned between the aerosol particle charging chamber (5) and the ion generating chamber (1), the interface body (7) having a hollow interior which is in fluid communication with the ion gen
    Type: Application
    Filed: June 10, 2014
    Publication date: May 5, 2016
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventor: Boris Zachar GORBUNOV
  • Publication number: 20160002700
    Abstract: The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.
    Type: Application
    Filed: March 12, 2015
    Publication date: January 7, 2016
    Applicant: Particle Measuring Systems, Inc.
    Inventors: Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Publication number: 20150355000
    Abstract: Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.
    Type: Application
    Filed: March 12, 2015
    Publication date: December 10, 2015
    Applicant: Particle Measuring Systems, Inc
    Inventors: Thomas BATES, Cliff KETCHAM, Paul B. HARTIGAN, Ronald W. ADKINS
  • Publication number: 20150000595
    Abstract: The invention provides an apparatus for increasing the size of gas-entrained particles in order to render the gas-entrained particles detectable by a particle detector, the apparatus comprising an evaporation chamber (2) and a condenser (7); the apparatus is configured so that vapour-laden gas from the evaporation chamber can flow into the condenser and condensation of the vaporisable substance onto gas-entrained particles in the condenser takes place to increase the size of the particles so that they are capable of being detected by a particle detector.
    Type: Application
    Filed: September 12, 2014
    Publication date: January 1, 2015
    Applicant: PARTICLE MEASURING SYSTEMS INC.
    Inventors: Boris Zachar GORBUNOV, Harald Wilhelm Julius GNEWUCH
  • Patent number: 8869593
    Abstract: The invention provides an apparatus for increasing the size of gas-entrained particles in order to render the gas-entrained particles detectable by a particle detector, the apparatus comprising an evaporation chamber (2) and a condenser (7); the apparatus is configured so that vapour-laden gas from the evaporation chamber can flow into the condenser and condensation of the vaporisable substance onto gas-entrained particles in the condenser takes place to increase the size of the particles so that they are capable of being detected by a particle detector.
    Type: Grant
    Filed: May 8, 2009
    Date of Patent: October 28, 2014
    Assignee: Particle Measuring Systems Inc.
    Inventors: Boris Zachar Gorbunov, Harald Wilhelm Julius Gnewuch
  • Patent number: 8800383
    Abstract: Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.
    Type: Grant
    Filed: August 24, 2010
    Date of Patent: August 12, 2014
    Assignee: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Patent number: 8427642
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: April 23, 2013
    Assignee: Particle Measuring Systems, Inc.
    Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Karen R. Sandberg
  • Publication number: 20120222495
    Abstract: Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.
    Type: Application
    Filed: August 24, 2010
    Publication date: September 6, 2012
    Applicant: Particle Measuring Systems, Inc.
    Inventor: Thomas Bates
  • Publication number: 20120140223
    Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
    Type: Application
    Filed: February 14, 2012
    Publication date: June 7, 2012
    Applicant: PARTICLE MEASURING SYSTEMS, INC.
    Inventors: John MITCHELL, Dwight A. SEHLER, Michael WILLIAMSON, David RICE, Jon SANDBERG, Karen R. SANDBERG