Patents Assigned to Patrick E. Crane
  • Patent number: 5943006
    Abstract: Special mathematical techniques are used to process accurate energy measurements in the focal plane of a high quality imaging system to produce high resolution images. The improved resolution exceeds the generally accepted Rayleigh limits. That is accomplished by adapting Fourier transform techniques and using both in-phase and quadrature or amplitude and phase components to recover the target scene. The measurement of the in-phase and quadrature or amplitude and phase components are taken in the focal plane and undergo parallel processing to preserve both amplitude and phase in the resulting image. A Fourier transform of the aperture characteristics is removed from a Fourier transform of the energy components to result in a Fourier transform of the image. The scene is recovered by taking an inverse Fourier transform of the result.
    Type: Grant
    Filed: October 24, 1997
    Date of Patent: August 24, 1999
    Assignee: Patrick E. Crane
    Inventors: Patrick E. Crane, E. Calvin Johnson
  • Patent number: 5912765
    Abstract: Diffraction patterns in a focal region are governed by immersing the focal region in dielectric medium having an index of refraction higher than one. The pattern of the focal region is made small by causing the focal region to be immersed in a body having an index of refraction greater than 1. The resulting diffraction pattern sensed appropriately in the focal region is independent of traditional aperture limitations in resolving power. Microwave pictures are taken at the same resolution as optical pictures using the same aperture size when an appropriate dielectric immersion material is provided.
    Type: Grant
    Filed: June 29, 1994
    Date of Patent: June 15, 1999
    Assignee: Patrick E. Crane
    Inventors: Patrick E. Crane, E. Calvin Johnson, Robert A. Wright