Abstract: An optical inspection method particularly suitable for viewing objects such as components on printed circuit boards, comprises the steps of viewing an object from above with a magnifying optical device and at the same time placing a side-viewing mirror in the optical path of the optical device facing the side of the object and tilted at an angle up to 90 degrees to the optical path so as to rotate an image of the side of the object by at least 90 degrees to present simultaneous front and side views of the object to an observer.
Type:
Grant
Filed:
May 26, 1987
Date of Patent:
January 3, 1989
Assignees:
Paul Stuart Kempf, Pilar Moreno Kempf Family Trust