Abstract: Embodiments relate to a computer-based method of checking a network to determine whether a certain number of copies of data are backed up onto the peer devices of the network. If the certain number of copies of the data are not backed up on the peer device on the network, then backing up the data on one or more network devices. If the certain number of copies of the data are backed up on the peer device of the network, then not backing up the data on the one or more network devices.

Abstract: One embodiment of the present invention keeps a record of memory accesses by an operating system. The records can indicate which memory locations do not need to be checked in a later test. In one embodiment, memory blocks that have been accessed since a predetermined time are not checked in a later memory test. This reduces the time required for the later memory test.

Abstract: A system for testing a memory page of a computer while an operating system is active. The system includes a hook function and a pattern generator. The hook function has software instructions that takes the place of a memory allocation/release scheme of the operating system. The system stores a test pattern generated by the pattern generator in the memory page upon receiving a request to release the memory page. Upon receiving a request to allocate the memory page, the system verifies the test pattern is correct to ensure the memory page is not defective. If the test pattern is incorrect, the defective memory page is removed from service.

Abstract: An apparatus and a method for testing memory of a computing device, and more specifically to testing a Central Processing Unit (CPU), a system memory, and a combination thereof. The computing system includes one or more CPUs, a system memory, input and output devices. Among other features, the apparatus and method described herein can remove either a defective CPU or a defective portion of system memory from the computing device. An exemplary apparatus and method also reports to a computer user whether any CPU or system memory is defective as well as specifically identifying the defective computing component. The apparatus and method also detects a first defect related to a first corrupted portion of an instruction of a test program code and a second defect related to a second corrupted portion of the instruction.

Abstract: One embodiment of the present invention keeps a record of memory accesses by an operating system. The records can indicate which memory locations do not need to be checked in a later test. In one embodiment, memory blocks that have been accessed since a predetermined time are not checked in a later memory test. This reduces the time required for the later memory test.

Abstract: A hardware access layer interface for performing diagnostics in a computer system having an operating system and at least one hardware device. The interface is a registering and synchronizing agent in the given operating system. The interface has a device driver for managing the hardware device, a kernel module for communicating with the device driver and the operating system, and a diagnostic module for coordinating with the kernel module and/or the device driver in order to perform diagnostics on the hardware device. The interface enables the device driver to publish its capabilities to interested diagnostic modules or the module responsible for managing the device.

Abstract: The present invention generally relates to the field of testing computing devices. More specifically, the present invention relates to a system and method for testing a universal serial bus (“USB”) within a computing device. In an exemplary embodiment, the system includes a test device and a test control module. The test device is connected to a USB port on the computing device. The test control module resides on the computing device and interacts with the test device to test the USB port. Once connected, the test device is used to monitor signals on the USB port exchanged between the test device and the USB port. Examples of signals that are monitored are the voltage levels, frame timing, and USB bus signals and power voltages. The test device then communicates the monitored information to the test control module for analysis.

Abstract: The present invention generally relates to event codes. More specifically, the present invention relates to an improved and extensible event code. An event code designed to identify an event is provided. In an exemplary embodiment, the event code of the present invention includes a set of predefined values and an optional set of implementation-driven values. The set of predefined values inform a user what kind of event has occurred and identify the various components which are related to this event. The set of predefined values further inform the user which of the various identified components are likely to have caused the event. Optionally, the set of implementation-driven values provides additional reference information which better enables the user to analyze the event. Additional self-help information is also available which may assist the user to address the event.

Abstract: A system for testing a memory page of a computer while an operating system is active. The system includes a hook function and a pattern generator. The hook function has software instructions that takes the place of a memory allocation/release scheme of the operating system. The system stores a test pattern generated by the pattern generator in the memory page upon receiving a request to release the memory page. Upon receiving a request to allocate the memory page, the system verifies the test pattern is correct to ensure the memory page is not defective. If the test pattern is incorrect, the defective memory page is removed from service.

Abstract: The present invention generally relates to the field of testing computing devices. More specifically, the present invention relates to a system and method for testing a universal serial bus (“USB”) within a computing device. In an exemplary embodiment, the system includes a test device and a test control module. The test device is connected to a USB port on the computing device. The test control module resides on the computing device and interacts with the test device to test the USB port. Once connected, the test device is used to monitor signals on the USB port exchanged between the test device and the USB port. Examples of signals that are monitored are the voltage levels, frame timing, and USB bus signals and power voltages. The test device then communicates the monitored information to the test control module for analysis.