Patents Assigned to PEEK TECHNOLOGIES, INC.
  • CONFIGURABLE DIAGNOSTIC PLATFORM SYSTEMS AND METHODS FOR PERFORMING CHEMICAL TEST ASSAYS
    Publication number: 20240151737
    Abstract: Provided are methods and systems that relate to configuring a diagnostic analyzer. The diagnostic analyzer may receive an identifier from a dual design test cartridge. The parameter module disposed within the diagnostic analyzer may determine parameters corresponding to the received test cartridge identifier.
    Type: Application
    Filed: February 17, 2022
    Publication date: May 9, 2024
    Applicant: PEEK TECHNOLOGIES, INC.
    Inventors: Wilma MANGAN, Alton B. OTIS, Jr., Tai NGO