Patents Assigned to PEMTRON CO., LTD.
  • Apparatus for measurement of surface profile
    Patent number: 8487999
    Abstract: The present invention relates to an apparatus for measurement of the surface profile detecting 2D-image of the surface of the object.
    Type: Grant
    Filed: March 30, 2009
    Date of Patent: July 16, 2013
    Assignee: Pemtron Co., Ltd.
    Inventors: Young-Woong Yoo, Young-Jin Choi, Cheol-Hoon Cho
  • APPARATUS FOR MEASUREMENT OF SURFACE PROFILE
    Publication number: 20100289893
    Abstract: The present invention relates to an apparatus for measurement of the surface profile detecting 2D-image of the surface of the object.
    Type: Application
    Filed: March 30, 2009
    Publication date: November 18, 2010
    Applicant: PEMTRON CO., LTD.
    Inventors: Young-Woong Yoo, Young-Jin Choi, Cheol-Hoon Cho