Patents Assigned to Perten Instruments North America Inc.
  • Patent number: 5258825
    Abstract: An optical analyzing apparatus (20) for obtaining a quantitative correlation spectroscopy measurements of an analyte concentration in a multiple constituent sample (24). The optical analyzing apparatus (20) employs a correlation spectroscopy algorithm which uses preselected wavelength light energy from both the visible light spectrum and the near-infrared (NIR) light spectrum to analyze multiconstituent samples. The optical analyzing apparatus (20) comprises a light emitter mechanism (22) formed for irradiating the sample (24) with a predetermined first wavelength of light energy in the visible light spectrum and a predetermined second wavelength of light energy in the NIR spectrum. The first wavelength is selected to be active in response to the presence of the analyte while the second wavelength is selected to be active in response to the presence of at least one of the remaining constituents in the sample (24).
    Type: Grant
    Filed: November 13, 1991
    Date of Patent: November 2, 1993
    Assignee: Perten Instruments North America, Inc.
    Inventors: David S. Reed, James J. Psotka
  • Patent number: 5227856
    Abstract: A sample holding apparatus (20) and method for use with an optical analyzing assembly (10) for irradiating a sample (33) with light energy. The sample holder apparatus (20) comprises a sample container (30) having a downwardly facing container opening (44), and a partition (32) movably positioned over the opening (44). A container support (24) is positioned adjacent the partition (32) and includes a surface (26) having an analyzing window (28) for transmitting the light energy therethrough. The container (30) is movably mounted to a transport mechanism (36) which permits the partition (32) to slidably retract from a closed position, across the opening (44), to an open position as the container (30) is urged onto the support surface (26). Consequently, the sample (33) contained in the container (30) is exposed and drawn into direct contact with the analyzing window (28).
    Type: Grant
    Filed: March 9, 1992
    Date of Patent: July 13, 1993
    Assignee: Perten Instruments North America Inc.
    Inventors: David S. Reed, Robert C. Funk