Abstract: A method for evaluating cosmetic defects of a device includes capturing a plurality of images of the device under a plurality of lighting conditions, processing the images of the device into one or more final images, identifying one or more defects of the device and computing a defect index from the one or more defects. The method may be performed with a system including one or more light sources, one or more cameras configured to capture a plurality of images of a device illuminated by the one or more light sources and one or more processors configured to control the lights sources and cameras, analyze the images captured by the one or more cameras, combine the images into a final image, identify one or more defects of the device and compute a defect index from the one or more defects.