Patents Assigned to PGL Corporation
  • Patent number: 4729174
    Abstract: A device (gage, data station, and software) and method to measure mean radius and deviations from mean radius of nominally cylindrical or conical shapes in a plane perpendicular to the nominal axis of revolution using curvature measurements at uniformly spaced intervals about the circumference is described. The system divides the contour of interest into equal segments and measures the local curvature at each point. The group of measurements combines with a closure constraint to produce a condition of mathematical overcompleteness. This is used to minimize the accumulation of measurement error.
    Type: Grant
    Filed: July 15, 1986
    Date of Patent: March 8, 1988
    Assignee: PGL Corporation
    Inventors: Paul R. Caron, Gilbert Fain, Lee E. Estes