Abstract: A method for cleaning parts employed during the processing of semiconductor wafers includes a first cleaning step for removing super-micron particles and a second cleaning step for removing sub-micron particles. The second step utilizes frozen carbon dioxide pellets and removes contaminant particles have a size of less than one micron. The cleaning method consistently removes substantially all sub-micron particles from a work surface.
Type:
Grant
Filed:
July 9, 1997
Date of Patent:
December 21, 1999
Assignee:
Phillip W. Bishop
Inventors:
Phillip W. Bishop, Alexander J. Harrover