Patents Assigned to PHLUXi, Inc.
  • Terahertz wave generation apparatus and inspection apparatus
    Patent number: 10481467
    Abstract: A terahertz wave generation apparatus includes a plurality of laser light sources configured to generate laser beams respectively having different wavelengths; and a terahertz wave generating element configured to receive the laser beams having different wavelengths and generate a terahertz wave from the laser beams. The plurality of laser light sources include fiber laser light sources respectively including parameters that can be controlled independently, and the terahertz wave generating element includes a nonlinear optical crystal.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: November 19, 2019
    Assignees: Ricoh Company, Ltd., PHLUXi, Inc.
    Inventors: Takumi Satoh, Yasuhiro Higashi, Yoshio Wada, Toshiyuki Ikeoh, Yoshiharu Urata
  • TERAHERTZ WAVE GENERATION APPARATUS AND INSPECTION APPARATUS
    Publication number: 20180335682
    Abstract: A terahertz wave generation apparatus includes a plurality of laser light sources configured to generate laser beams respectively having different wavelengths; and a terahertz wave generating element configured to receive the laser beams having different wavelengths and generate a terahertz wave from the laser beams. The plurality of laser light sources include fiber laser light sources respectively including parameters that can be controlled independently, and the terahertz wave generating element includes a nonlinear optical crystal.
    Type: Application
    Filed: May 17, 2018
    Publication date: November 22, 2018
    Applicants: Ricoh Company, Ltd., PHLUXi, Inc.
    Inventors: Takumi SATOH, Yasuhiro HIGASHI, Yoshio WADA, Toshiyuki IKEOH, Yoshiharu URATA