Patents Assigned to Photo Diagnostic Systems, Inc.
  • Patent number: 11373345
    Abstract: A method for artifact correction in computed tomography, the method comprising: (1) acquiring a plurality of data sets associated with different X-ray energies (i.e., D1, D2, D3 . . . Dn); (2) generating a plurality of preliminary images from the different energy data sets acquired in Step (1) (i.e., I1, I2, I3 . . . In); (3) using a mathematical function to operate on the preliminary images generated in Step (2) to identify the sources of the image artifact (i.e., the artifact source image, or ASI, where ASI=f(I1, I2, I3 . . . In)); (4) forward projecting the ASI to produce ASD=fp(ASI); (5) selecting and combining the original data sets D1, D2, D3 . . . Dn in order to produce a new subset of the data associated with the artifact, whereby to produce the artifact reduced data, or ARD, where ARD=f(ASD, D1, D2, D3 . . . Dn); (6) generating a repaired data set (RpD) to keep low-energy data in artifact-free data and introduce high-energy data in regions impacted by the artifact, where RpD=f(ARD, D1, D2, D3 . . .
    Type: Grant
    Filed: February 25, 2020
    Date of Patent: June 28, 2022
    Assignee: Photo Diagnostic Systems, Inc.
    Inventor: Matthew Len Keeler
  • Patent number: 10928544
    Abstract: A scanning system includes an improved arrangement of shielding curtains to limit radiation leakage while achieving high throughput and limiting system length. The scanning system includes a segmented conveyor, including a faster conveyor through a shielding region to improve increase throughput of scanned articles, and a slower conveyor through a scanning region to ensure acceptable scanning performance. The curtains are arranged based on the changing gap distance between the articles that results from the changing conveyor speeds.
    Type: Grant
    Filed: November 2, 2018
    Date of Patent: February 23, 2021
    Assignee: Photo Diagnostic Systems, Inc.
    Inventors: Benjamin Galen Connelly, James Michael Connelly, Bernard M. Gordon, Olof Johnson
  • Patent number: 10768337
    Abstract: A method for scanning an object in an X-ray security inspection system, wherein the X-ray security inspection system comprises an ingoing tunnel equipped with radiation-shielding curtains, an X-ray section and an outgoing tunnel equipped with radiation-shielding curtains, the method comprising: passing the object through the ingoing tunnel at a first rate of speed and with a first extent of separation between successive objects; passing the object through the X-ray section at a second rate of speed and with a second extent of separation between successive objects; and passing the object through the outgoing tunnel at a third rate of speed and with a third extent of separation between successive objects; wherein the second rate of speed is less than the first rate of speed and the third rate of speed, and wherein the second extent of separation between successive objects is less than the first extent of separation between successive objects and the third extent of separation between successive objects.
    Type: Grant
    Filed: November 19, 2018
    Date of Patent: September 8, 2020
    Assignee: Photo Diagnostic Systems, Inc.
    Inventors: Bernard M. Gordon, Olof Johnson
  • Patent number: 10573030
    Abstract: A method for artifact correction in computed tomography, the method including: (1) acquiring a plurality of data sets associated with at least one low X-ray energy, and at least one high X-ray energy; (2) generating a plurality of preliminary images from the plurality of data sets; (3) identifying sources of an artifact source image; (4) forward projecting the artifact source image to produce artifact source data; (5) selecting and combining the plurality of data sets acquired in order to produce a new subset of data associated with the artifact, whereby to produce artifact reduced data; (6) generating a repaired data set to keep data sets associated with the low X-ray energy in artifact-free data and to introduce data sets associated with the high X-ray energy in regions impacted by an artifact; and (7) generating a final reduced artifact image from the repaired data set.
    Type: Grant
    Filed: April 7, 2017
    Date of Patent: February 25, 2020
    Assignee: Photo Diagnostic Systems, Inc.
    Inventor: Matthew Len Keeler
  • Patent number: 10429323
    Abstract: An improved dual energy CT imaging system for providing improved imaging and improved material identification.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: October 1, 2019
    Assignee: Photo Diagnostic Systems, Inc.
    Inventors: William A. Worstell, Matthew Len Keeler, Olof Johnson, Bernard M. Gordon