Patents Assigned to Photon etc. inc.
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Patent number: 12163884Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.Type: GrantFiled: November 20, 2020Date of Patent: December 10, 2024Assignee: PHOTON ETC. INC.Inventors: David Rioux, Daniel Oyama
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Publication number: 20220412888Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.Type: ApplicationFiled: November 20, 2020Publication date: December 29, 2022Applicant: PHOTON ETC. INC.Inventors: David RIOUX, Daniel OYAMA
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Patent number: 8237844Abstract: The present invention concerns a method and camera for obtaining a high-contrast image of a predetermined target present in an area under observation. The method involves obtaining an in-band image of the observation area including the target using a filter whose bands are aligned with selected characteristic wavelength bands of the target and an out-of-band image of the observation area excluding the target using the filter with its bands non-aligned with the selected characteristic wavelength bands of the target. Processing of the in-band and out-of-band images results in a high-contrast image highlighting the presence of the target in the observation area and thereby allowing its detection and monitoring.Type: GrantFiled: April 25, 2006Date of Patent: August 7, 2012Assignee: Photon etc. inc.Inventors: Sebastien Blais-Ouellette, Ed Wishnow
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Publication number: 20080252731Abstract: The present invention concerns a method and camera for obtaining a high-contrast image of a predetermined target present in an area under observation. The method involves obtaining an in-band image of the observation area including the target using a filter whose bands are aligned with selected characteristic wavelength bands of the target and an out-of-band image of the observation area excluding the target using the filter with its bands non-aligned with the selected characteristic wavelength bands of the target. Processing of the in-band and out-of-band images results in a high-contrast image highlighting the presence of the target in the observation area and thereby allowing its detection and monitoring.Type: ApplicationFiled: April 25, 2006Publication date: October 16, 2008Applicant: Photon Etc. Inc.Inventors: Sebastien Blais-Ouellette, Ed Wishnow