Patents Assigned to Photon etc. inc.
  • Patent number: 12163884
    Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.
    Type: Grant
    Filed: November 20, 2020
    Date of Patent: December 10, 2024
    Assignee: PHOTON ETC. INC.
    Inventors: David Rioux, Daniel Oyama
  • Publication number: 20220412888
    Abstract: There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.
    Type: Application
    Filed: November 20, 2020
    Publication date: December 29, 2022
    Applicant: PHOTON ETC. INC.
    Inventors: David RIOUX, Daniel OYAMA
  • Patent number: 8237844
    Abstract: The present invention concerns a method and camera for obtaining a high-contrast image of a predetermined target present in an area under observation. The method involves obtaining an in-band image of the observation area including the target using a filter whose bands are aligned with selected characteristic wavelength bands of the target and an out-of-band image of the observation area excluding the target using the filter with its bands non-aligned with the selected characteristic wavelength bands of the target. Processing of the in-band and out-of-band images results in a high-contrast image highlighting the presence of the target in the observation area and thereby allowing its detection and monitoring.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: August 7, 2012
    Assignee: Photon etc. inc.
    Inventors: Sebastien Blais-Ouellette, Ed Wishnow
  • Publication number: 20080252731
    Abstract: The present invention concerns a method and camera for obtaining a high-contrast image of a predetermined target present in an area under observation. The method involves obtaining an in-band image of the observation area including the target using a filter whose bands are aligned with selected characteristic wavelength bands of the target and an out-of-band image of the observation area excluding the target using the filter with its bands non-aligned with the selected characteristic wavelength bands of the target. Processing of the in-band and out-of-band images results in a high-contrast image highlighting the presence of the target in the observation area and thereby allowing its detection and monitoring.
    Type: Application
    Filed: April 25, 2006
    Publication date: October 16, 2008
    Applicant: Photon Etc. Inc.
    Inventors: Sebastien Blais-Ouellette, Ed Wishnow