Patents Assigned to Photon, Inc.
  • Patent number: 7366382
    Abstract: An optical beam diagnostic device includes one or more sets of coherent optical fiber bundles, wherein one end of the coherent optical fiber bundles is arranged to receive optical information from a dynamic moving or static optical beam or beams, and the other end of the coherent optical fiber bundles is arranged to transmit the optical information to a sensor array. Data from the sensor array can then be simultaneously acquired by an analysis system and analyzed to determine one or more characteristics of the optical beam.
    Type: Grant
    Filed: September 24, 2004
    Date of Patent: April 29, 2008
    Assignee: Photon, Inc.
    Inventors: Jeffrey L. Guttman, John M. Fleischer
  • Patent number: 7321423
    Abstract: In accordance with embodiments of the present invention, a goniospectrophotometer is provided for quickly obtaining a goniospectrum using a goniospectrophotometer. In some embodiments, a parabolic reflector is used to optically transform the angular space of a source at the parabola focus into a linear space and facilitate the use of a single diffracting element and area camera to simultaneously measure the angular spectrum of the source. Spectra corresponding to zenith angles of light reflection by the parabolic reflector can be acquired by a detector and analyzed in a computer.
    Type: Grant
    Filed: August 9, 2004
    Date of Patent: January 22, 2008
    Assignee: Photon, Inc.
    Inventor: Jeffrey L. Guttman
  • Patent number: 6788398
    Abstract: A method and apparatus for rapid measurements of far-field radiation profiles having a large dynamic range from an optical source is disclosed. Some embodiments of the apparatus include a collector coupled to a rotating hub so that the rotation of an entrance to the collector defines a plane, a detector coupled to receive light captured at the entrance to the collector, and detector electronics having a programmable gain coupled to receive a signal from the detector, Some embodiments may include a rotatable entrance mirror for reflecting light from the optical source into the plane of the entrance of the collector. In some embodiments, the optical source is fixed relative to the plane of the entrance of the collector. In some embodiments, the optical source is rotatable in the plane defined by the entrance of the collector. In some embodiments, the source can be an optical fiber. In some embodiments, the source can be a material irradiated by a laser.
    Type: Grant
    Filed: October 27, 2000
    Date of Patent: September 7, 2004
    Assignee: Photon, Inc.
    Inventor: Jeffrey L. Guttman
  • Patent number: 5949534
    Abstract: A gonioradiometric scanning apparatus and method for measuring the near and/or far field radiation pattern of radiating optical sources such as laser diodes (LD), light emitting diodes (LED), optical fibers, flat panel displays, and luminaires is described. The scanning apparatus incorporates a deflector for selecting an azimuth angle through the optical source to be measured, a rotating apparatus which collects light while scanning about the source, an optical commutator, and a detector. The rotating apparatus comprises a cylindrical hub and an optical collector using either an optical fiber or a train of reflectors, such as mirrors or retro-reflectors. The optical collector provides a means for both collecting light and for directing the beam emanating from the deflector to a place opposite the detector at which optical commutation occurs.
    Type: Grant
    Filed: January 23, 1998
    Date of Patent: September 7, 1999
    Assignee: Photon, Inc.
    Inventors: Jeffrey L. Guttman, John M. Fleischer, Simon E. Saba
  • Patent number: 5329350
    Abstract: An optical system for the attenuation of laser light for measurement purposes which includes four logical subassemblies including a first attenuator subassembly for the attenuation of high power laser light, a second attenuator subassembly for lower power attenuation of the laser light, a third lens subassembly for collecting beam size data simultaneously at multiple locations in space, and a fourth logical subassembly including a beam measuring assembly for recording the beam size data received from the lens subassembly for analysis of the beam characteristics. The first attenuator subassembly is provided with a pair of reflecting, opposed facing, fixed wedges. The reflecting wedges are selectively tilted to eliminate interference effects between their inward facing reflecting surfaces. The second attenuator subassembly further includes a pair of opposed facing and movable wedges arranged in series with a fixed filter.
    Type: Grant
    Filed: May 21, 1992
    Date of Patent: July 12, 1994
    Assignee: Photon, Inc.
    Inventors: David L. Wright, John M. Fleischer
  • Patent number: 5258821
    Abstract: A laser beam profiler having a movable member on which is mounted a means adapted to be moved through a laser beam for measuring the profile of the laser beam. The profiler comprises an interferometer which uses a multimode diode laser to generate a reference laser beam and a distance measuring laser beam. A retro-reflector is rigidly attached to the movable member and varies the path length of the distance measuring laser beam as the movable member is moved. A photodetector responsive to the reference laser beam and the distance measuring laser beam as said movable member is moved provides a frequency modulated output signal, said output signal having an envelope, the amplitude of which varies as a function of .DELTA.l, where .DELTA.l is the difference in the path lengths of said reference and said distance measuring laser beams, said interferometer, including said movable member, being so arranged that the amplitude of said envelope of said output signal is maximum when .DELTA.l is zero.
    Type: Grant
    Filed: April 20, 1990
    Date of Patent: November 2, 1993
    Assignee: Photon, Inc.
    Inventors: David E. Doggett, Donald W. Wapenski