Abstract: A compact Raman probe integrated with a wavelength-stabilized laser source is disclosed. The output beam of the laser source has an elongated cross-section that is focused onto a target of interest. Raman and Rayleigh scattered light is collected, collimated, and filtered by free-space optics to form a beam that is coupled to the input of a multimode optical fiber having an elongated core that is aligned to edge slits of an optical spectrometer.

Abstract: A system and method for triggering data acquisition in a semiconductor laser system including outputting electromagnetic energy from the semiconductor laser over a range of wavelengths according to a signaling path. The signaling path includes a plurality of discrete data inputs to the semiconductor laser for outputting electromagnetic energy over a range of wavelengths and the signaling path includes one or more perturbances in transitioning from one wavelength to another wavelength along the signaling path. A series of triggering signals are generated for input to a measurement system by the semiconductor laser. The series of triggering signals include a non-uniform period between at least a first triggering signal and an adjacent second triggering signal, and the non-uniform period corresponds to at least one perturbance. The electromagnetic energy output from the semiconductor laser is detected based on the series of triggering signals.

Abstract: A system and method for triggering data acquisition in a semiconductor laser system including outputting electromagnetic energy from the semiconductor laser over a range of wavelengths according to a signaling path. The signaling path includes a plurality of discrete data inputs to the semiconductor laser for outputting electromagnetic energy over a range of wavelengths and the signaling path includes one or more perturbances in transitioning from one wavelength to another wavelength along the signaling path. A series of triggering signals are generated for input to a measurement system by the semiconductor laser. The electromagnetic energy output from the semiconductor laser is detected based on the series of triggering signals. The detected electromagnetic energy is compared with a valid data vector, wherein the valid data vector includes one or more criteria and/or values that is used to differentiate valid data from invalid data corresponding to the detected electromagnetic energy.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: Disclosed are systems and methods for using a semiconductor optical amplifier (SOA) as an optical modulator for pulsed signals. In accordance with the principles of the invention, the SOA can be biased with a negative voltage to suppress transmission and improve modulator extinction and biased with a positive pulsed signal with sufficient amplitude to forward bias the amplifier (SOA), both transmitting the carrier and increasing its amplitude by means of a gain provided by the SOA under forward biased conditions. In addition, the forward bias voltage may be selected to compensate for losses within the SOA.

Abstract: A system and method to determine data sets of front mirror current, back mirror current and phase current that change the wavelength output by a semiconductor laser in a prescribed trajectory versus time, while maintaining the maximum side-mode suppression ratio at each point during the sweep.

Abstract: A method for sweeping an electromagnetic radiation source (12) to produce single mode operation having an optimized side-mode suppression ratio over a continuous range of wavelengths within a prescribed temporal profile, the electromagnetic radiation source is configured to output electromagnetic radiation at a given wavelength based upon parameters. The method includes determining a set of parameter combinations that satisfy a condition for a desired set of wavelengths and a maximum side mode suppression ratio over the range of wavelengths. The set of parameter combinations define sub-paths for transitioning from one wavelength to another wavelength. Combinations of select sub-paths provide a multivariate path for transitioning over the range of wavelengths. The method also includes controlling the semiconductor laser to emit electromagnetic radiation over the range of wavelengths by traversing the multivariate path in a desired manner.

Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: A system (10, 20) and method including a wavelength tuning mechanism and a laser path length tuning mechanism for reducing discontinuities in a sweep range. A processor (14) is coupled to a wavelength monitoring device (18) and the tuning mechanisms. The processor analyzes data from the wavelength monitor to adjust the wavelength tuning and cavity length tuning at discontinuities in the wavelength sweep to reduce the discontinuities.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method to determine data sets of front mirror current, back mirror current and phase current that change the wavelength output by a semiconductor laser in a prescribed trajectory versus time, while maintaining the maximum side-mode suppression ratio at each point during the sweep.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: A system and method for sweeping electromagnetic radiation over a first coherence length and a second length over a range of wavelengths to generate an image. Electromagnetic radiation having a first coherence length is generated and swept over a range of wavelengths. Electromagnetic radiation having a second coherence length is generated and swept over a range of wavelengths. The electromagnetic radiation is splitting through a reference path and a sample path; Electromagnetic radiation returned from the reference path and the sample path is detected, wherein the detector generates output signals corresponding to the received electromagnetic radiation. In one embodiment, the output signals are processed to generate an image. The image may be interleaved with data corresponding to the electromagnetic radiation having the first coherence length and the second coherence length.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: In a method of calibrating a light delivery device (10) having a solid state light source (12), for example comprising LEDs of an LED array, and an intensity control unit (16) comprising LED array driver and a dimmer module for generating a control signal for controlling at least the intensity of the light source, the light source is temporarily connected by a light guide (24; 24, 26) to a radiometer (38) for detecting irradiance of the delivered light. The light delivery device has a memory (30) for storing control signal parameters and associated radiance levels. The light delivery device is calibrated by adjusting the control signal parameters, e.g.

Abstract: A linear electromechanical translation apparatus is provided of the type comprising first and second clamps fixed to a support, first and second elongate movable members each extending through one of the clamps, and an extension actuator connected between the movable members and adapted to move each one of the elongate movable members longitudinally relative to the other member as the extension actuator is extended or retracted. The apparatus is characterized in that the first elongate movable member has a rear end connected to a front end of the extension actuator, and the second movable member has a rear end connected to a rear end of the actuator and has a forwardly extending elongate portion which lies beside and parallel to the first elongate movable member. Both the clamp assemblies may be located forwardly of the front end of the actuator.