Abstract: A semiconductor device for emitting electromagnetic radiation, and to a method of producing the same, which can be used as a semiconductor-based, structured light source. The semiconductor device comprises a layer stack structure composed of an n-doped layer, an active layer and a p-doped layer, as well as a connection structure comprising conductor layers and at least one insulator layer, the conductor layers being arranged, parallel to and spaced apart from one another, along a first direction that is parallel to the active layer of the layer stack structure, and at least one insulator layer being arranged between at least two conductor layers, one or more conductor layers being electrically connected to the p-doped layer of the layer stack structure.

Abstract: A method for determining a curvature and/or torsion of an optical waveguide of a fibre-optic sensor, comprising at least two Bragg gratings introduced into the optical waveguide and extending through a common cross-sectional plane, situated in a radial direction, through the optical waveguide, wherein the Bragg gratings are introduced in the core and/or on the boundary between the core and the cladding and/or in an inner edge region of the cladding within an evanescence region of the light, the method comprising: providing reference data of intensities of reflected light portions of light coupled into the optical waveguide, in particular depending on known reference deformations of the optical waveguide, measuring at least one light intensity of reflected light portions of light coupled into the optical waveguide, wherein the optical waveguide has a deformation to be determined, and determining the deformation by comparing the light intensity with the reference data.

Abstract: A method for determining a curvature and/or torsion of an optical waveguide of a fibre-optic sensor, comprising at least two Bragg gratings introduced into the optical waveguide and extending through a common cross-sectional plane, situated in a radial direction, through the optical waveguide, wherein the Bragg gratings are introduced in the core and/or on the boundary between the core and the cladding and/or in an inner edge region of the cladding within an evanescence region of the light, the method comprising: providing reference data of intensities of reflected light portions of light coupled into the optical waveguide, in particular depending on known reference deformations of the optical waveguide, measuring at least one light intensity of reflected light portions of light coupled into the optical waveguide, wherein the optical waveguide has a deformation to be determined, and determining the deformation by comparing the light intensity with the reference data.