Patents Assigned to Photothermal Spectroscopy Corp.
  • Patent number: 12209950
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: January 31, 2023
    Date of Patent: January 28, 2025
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 12140475
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: May 3, 2023
    Date of Patent: November 12, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater
  • Publication number: 20240361243
    Abstract: Methods and systems described herein detect autofluorescence of a sample.
    Type: Application
    Filed: April 4, 2024
    Publication date: October 31, 2024
    Applicant: PHOTOTHERMAL SPECTROSCOPY CORP.
    Inventor: Craig Prater
  • Patent number: 12066328
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: September 28, 2022
    Date of Patent: August 20, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater
  • Patent number: 11982621
    Abstract: Methods and systems described herein detect autofluorescence of a sample. These methods and systems obviate the need for addition of fluorophores to samples to create IR absorption.
    Type: Grant
    Filed: October 1, 2022
    Date of Patent: May 14, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventor: Craig Prater
  • Publication number: 20240118208
    Abstract: Methods and systems described herein detect autofluorescence of a sample.
    Type: Application
    Filed: October 1, 2022
    Publication date: April 11, 2024
    Applicant: Photothermal Spectroscopy Corp.
    Inventor: Craig Prater
  • Publication number: 20240110872
    Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.
    Type: Application
    Filed: December 13, 2023
    Publication date: April 4, 2024
    Applicant: PHOTOTHERMAL SPECTROSCOPY CORP.
    Inventor: Craig Prater
  • Publication number: 20240060885
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Application
    Filed: October 30, 2023
    Publication date: February 22, 2024
    Applicant: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • Patent number: 11885745
    Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.
    Type: Grant
    Filed: July 25, 2022
    Date of Patent: January 30, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventor: Craig Prater
  • Patent number: 11879837
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Grant
    Filed: May 31, 2019
    Date of Patent: January 23, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • Patent number: 11774354
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Grant
    Filed: September 28, 2022
    Date of Patent: October 3, 2023
    Assignee: Photothermal Spectroscopy Corp
    Inventors: Craig Prater, David Grigg, Derek Decker
  • Publication number: 20230251190
    Abstract: Improvements in spectroscopy are disclosed herein that rely on the interaction of both an infrared beam and a probe beam with a sample. These beams are used in a pump-probe arrangement, with a fiber optic probe collecting the beams of infrared and probe radiation from the infrared source and delivering it to the sample. At least a portion of the beam of infrared radiation and the beam of probe radiation overlap one another on the sample. The fiber also collects probe radiation that has interacted with the sample. A detector can use this collected signal to indicate an intensity of the collected probe radiation, and an analyzer can generate a signal indicative of infrared absorption of the sample adjacent the fiber.
    Type: Application
    Filed: June 25, 2021
    Publication date: August 10, 2023
    Applicant: Photothermal Spectroscopy Corp.
    Inventor: Craig PRATER
  • Patent number: 11680892
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: June 20, 2023
    Assignee: Photothermal Spectroscopy Corp
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 11519861
    Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.
    Type: Grant
    Filed: July 20, 2021
    Date of Patent: December 6, 2022
    Assignee: Photothermal Spectroscopy Corp
    Inventor: Craig Prater
  • Patent number: 11486761
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: May 31, 2019
    Date of Patent: November 1, 2022
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater
  • Patent number: 11480518
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: October 25, 2022
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, David Grigg, Derek Decker
  • Patent number: 11002665
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: May 11, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 10969405
    Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 ?m or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: April 6, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Roshan Shetty, Kevin Kjoller, Craig Prater
  • Patent number: 10942116
    Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: March 9, 2021
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
  • Patent number: 10809184
    Abstract: Properties of a sample that are dependent upon wavelength, such as IR absorption, can be detected and deconstructed into wavelets or other basis functions. These basis functions can be compared to determine which have a relatively high likelihood of being noise or signal, and an attenuation factor can be applied to each wavelet. A spectrum can be reconstructed from these wavelets that exhibits a significantly higher signal-to-noise ratio than raw data co-adding would produce in significantly less measurement time.
    Type: Grant
    Filed: March 27, 2019
    Date of Patent: October 20, 2020
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Mustafa Kansiz