Patents Assigned to Photothermal Spectroscopy Corp.
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Patent number: 12209950Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.Type: GrantFiled: January 31, 2023Date of Patent: January 28, 2025Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
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Patent number: 12140475Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.Type: GrantFiled: May 3, 2023Date of Patent: November 12, 2024Assignee: Photothermal Spectroscopy Corp.Inventors: Derek Decker, Craig Prater
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Publication number: 20240361243Abstract: Methods and systems described herein detect autofluorescence of a sample.Type: ApplicationFiled: April 4, 2024Publication date: October 31, 2024Applicant: PHOTOTHERMAL SPECTROSCOPY CORP.Inventor: Craig Prater
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Patent number: 12066328Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.Type: GrantFiled: September 28, 2022Date of Patent: August 20, 2024Assignee: Photothermal Spectroscopy Corp.Inventors: Derek Decker, Craig Prater
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Patent number: 11982621Abstract: Methods and systems described herein detect autofluorescence of a sample. These methods and systems obviate the need for addition of fluorophores to samples to create IR absorption.Type: GrantFiled: October 1, 2022Date of Patent: May 14, 2024Assignee: Photothermal Spectroscopy Corp.Inventor: Craig Prater
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Publication number: 20240118208Abstract: Methods and systems described herein detect autofluorescence of a sample.Type: ApplicationFiled: October 1, 2022Publication date: April 11, 2024Applicant: Photothermal Spectroscopy Corp.Inventor: Craig Prater
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Publication number: 20240110872Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.Type: ApplicationFiled: December 13, 2023Publication date: April 4, 2024Applicant: PHOTOTHERMAL SPECTROSCOPY CORP.Inventor: Craig Prater
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Publication number: 20240060885Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.Type: ApplicationFiled: October 30, 2023Publication date: February 22, 2024Applicant: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Derek Decker, Roshan Shetty
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Patent number: 11885745Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.Type: GrantFiled: July 25, 2022Date of Patent: January 30, 2024Assignee: Photothermal Spectroscopy Corp.Inventor: Craig Prater
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Patent number: 11879837Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.Type: GrantFiled: May 31, 2019Date of Patent: January 23, 2024Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Derek Decker, Roshan Shetty
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Patent number: 11774354Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.Type: GrantFiled: September 28, 2022Date of Patent: October 3, 2023Assignee: Photothermal Spectroscopy CorpInventors: Craig Prater, David Grigg, Derek Decker
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Publication number: 20230251190Abstract: Improvements in spectroscopy are disclosed herein that rely on the interaction of both an infrared beam and a probe beam with a sample. These beams are used in a pump-probe arrangement, with a fiber optic probe collecting the beams of infrared and probe radiation from the infrared source and delivering it to the sample. At least a portion of the beam of infrared radiation and the beam of probe radiation overlap one another on the sample. The fiber also collects probe radiation that has interacted with the sample. A detector can use this collected signal to indicate an intensity of the collected probe radiation, and an analyzer can generate a signal indicative of infrared absorption of the sample adjacent the fiber.Type: ApplicationFiled: June 25, 2021Publication date: August 10, 2023Applicant: Photothermal Spectroscopy Corp.Inventor: Craig PRATER
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Patent number: 11680892Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.Type: GrantFiled: May 10, 2021Date of Patent: June 20, 2023Assignee: Photothermal Spectroscopy CorpInventors: Craig Prater, Kevin Kjoller, Roshan Shetty
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Patent number: 11519861Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.Type: GrantFiled: July 20, 2021Date of Patent: December 6, 2022Assignee: Photothermal Spectroscopy CorpInventor: Craig Prater
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Patent number: 11486761Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.Type: GrantFiled: May 31, 2019Date of Patent: November 1, 2022Assignee: Photothermal Spectroscopy Corp.Inventors: Derek Decker, Craig Prater
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Patent number: 11480518Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.Type: GrantFiled: December 3, 2019Date of Patent: October 25, 2022Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, David Grigg, Derek Decker
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Patent number: 11002665Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.Type: GrantFiled: November 29, 2017Date of Patent: May 11, 2021Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
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Patent number: 10969405Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 ?m or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip.Type: GrantFiled: November 29, 2017Date of Patent: April 6, 2021Assignee: Photothermal Spectroscopy Corp.Inventors: Roshan Shetty, Kevin Kjoller, Craig Prater
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Patent number: 10942116Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.Type: GrantFiled: October 9, 2018Date of Patent: March 9, 2021Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Kevin Kjoller, Roshan Shetty
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Patent number: 10809184Abstract: Properties of a sample that are dependent upon wavelength, such as IR absorption, can be detected and deconstructed into wavelets or other basis functions. These basis functions can be compared to determine which have a relatively high likelihood of being noise or signal, and an attenuation factor can be applied to each wavelet. A spectrum can be reconstructed from these wavelets that exhibits a significantly higher signal-to-noise ratio than raw data co-adding would produce in significantly less measurement time.Type: GrantFiled: March 27, 2019Date of Patent: October 20, 2020Assignee: Photothermal Spectroscopy Corp.Inventors: Craig Prater, Mustafa Kansiz