Patents Assigned to Phyzchemix Corporation
  • Publication number: 20100062602
    Abstract: To provide an etching method employing a novel CVD system and an etching apparatus applicable to the method. In the etching method, performed are an adsorption step of employing halogen radicals generated from a halogen through formation of a plasma thereof, and a precursor 24 formed from the halogen and a noble metal component generated through etching of a noble metal member 11 by the halogen radicals, wherein crystal nuclei of the precursor 24 are caused to be adsorbed on a substrate 3; and an etching step of anisotropically etching, in a thickness direction by the halogen radicals, a portion of the substrate 3 on which the crystal nuclei have been adsorbed.
    Type: Application
    Filed: April 28, 2006
    Publication date: March 11, 2010
    Applicants: Phyzchemix Corporation, Canon Avelva Corporation
    Inventors: Hitoshi Sakamoto, Chikako Kobayashi
  • Publication number: 20090095425
    Abstract: An apparatus for forming a metal film, including a reaction vessel for housing a substrate, a precursor feeding device for bubbling a carrier gas through a liquid organometallic complex, vaporizing the organometallic complex, producing a precursor from the vaporized organometallic complex, and feeding the precursor into the reaction vessel, a rotating magnetic field generator for creating a rotating magnetic field in a space above the substrate, and a second plasma generator for generating a plasma from a reducing gas fed into the reaction vessel.
    Type: Application
    Filed: October 8, 2008
    Publication date: April 16, 2009
    Applicant: PHYZCHEMIX CORPORATION
    Inventors: Hitoshi SAKAMOTO, Toshihiko NISHIMORI, Saneyuki GOYA, Takao ABE, Noriaki UEDA
  • Patent number: 7262500
    Abstract: In a metal film production apparatus, a copper plate member is etched with a Cl2 gas plasma within a chamber to form a precursor comprising a Cu component and a Cl2 gas; and the temperatures of the copper plate member and a substrate and a difference between their temperatures are controlled as predetermined, to deposit the Cu component of the precursor on the substrate, thereby forming a film of Cu. In this apparatus, Cl* is formed in an excitation chamber of a passage communicating with the interior of the chamber to flow a Cl2 gas, and the Cl* is supplied into the chamber to withdraw a Cl2 gas from the precursor adsorbed onto the substrate, thereby promoting a Cu film formation reaction. The apparatus has a high film formation speed, can use an inexpensive starting material, and can minimize impurities remaining in the film.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: August 28, 2007
    Assignee: Phyzchemix Corporation
    Inventors: Hitoshi Sakamoto, Naoki Yahata, Toshihiko Nishimori, Yoshiyuki Ooba, Hiroshi Tonegawa, Ikumasa Koshiro, Yuzuru Ogura