Patents Assigned to Pintail Technologies, Inc.
  • Publication number: 20080256406
    Abstract: There is provided an improved testing system. More specifically, in one embodiment, there is provided a method including accessing machine overall equipment effectiveness or efficiency (OEE) data including machine generated operational event states of an automated testing (ATE) system and times the machine generated operational event states occurred, receiving operator OEE data including operator entered operational event states of the ATE and times the operator observed operational event states, and combining the machine OEE data and the operator OEE data to generate merge OEE data.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: PINTAIL TECHNOLOGIES, INC.
    Inventor: Keith Arnold
  • Patent number: 6711514
    Abstract: Method, apparatus and product for analyzing a quality control regimen comprising one or more quality control tests, to determine if the tests are in statistical control, and therefore could be removed from the regimen or sampled at a different rate. On sample data relating to each of the tests, there is determined Cpi, a measure of the spread of the data, which is simply the ratio of the magnitude of the actual range of the data, to the magnitude of calculated statistical range of the data. There is also determined CPKi, which is a measure of how close the spread of the data is to the upper or lower limit of the data. For convenience, the magnitude of Cpi is represented as a vertical bar graph, with the value of CPKi shown as a position of the bar graph within normalized limits. Using Cpi and CPKi decisions regarding removal of each the test can be made.
    Type: Grant
    Filed: May 22, 2000
    Date of Patent: March 23, 2004
    Assignee: Pintail Technologies, Inc.
    Inventor: Jeffrey N. Bibbee