Abstract: A testing system for automatic testing of circuit boards (1) in a circuit board manufacturing line. The testing system comprises a set (I) of test modules (4) comprising a testing apparatus. Each test module comprises a horizontal module conveyor (5) for conveying a circuit board (1) into and out of the test module. The test modules are arranged in a superposed relation with respect to each other. The set (I) contains test modules differing from each other so that the testing operations performed by these test modules are different from each other. A feed device (6) has been fitted to receive circuit boards from the first line conveyor (3) and to feed them into the test modules (4).

Abstract: Testing system for automatic testing of circuit boards (1) in a circuit board manufacturing line. The system comprises a set of test modules (4) comprising a testing apparatus, each test module comprising a horizontal module conveyor (5) for moving a circuit board (1) into and out of the test module, which test modules are arranged into a superposed relation with respect to each other. A feed device (6) has been fitted to receive and arrange a number of circuit boards from a first line conveyor (3) into a superposed relation with respect to each other so that the circuit boards (1) lie at a distance from each other corresponding to the distance between the module conveyors (5) and to feed the circuit boards substantially simultaneously into the test modules (4).

Abstract: An assembly line comprising a number of pallets (1) carrying electronic components for assembly, provided with individual RF-tags (2) containing stored product information, a main conveyor (3) in the shape of an endless loop, conveying pallets (1); assembly stations (4) spaced along the main conveyor. Each station is equipped with a reading device (6) for reading the RF-tags and a data processing apparatus controlling the work station operations, depending on the data read off the RF-tag; an automatic storage system (7) placed in the vicinity of workstations (4) comprising a number of storage devices (8), as well as transfer means (9) feeding pre-selected components from a pre-selected storage device to the assembly stations.

Abstract: Procedure and system for inspecting a component (1) with leads to determine its fitness for assembly before the component is placed on a circuit board. A narrow illuminating beam (10) is directed from a light source (9) at a light-sensitive detector (11). The component (1) is moved in relation to the illuminating beam so that at least one of the leads (4) of the component passes through the illuminating beam and so that the position of the gripper (7) holding the component as a function of time is known. The position data of the gripper is registered. The signal produced by the light-sensitive detector as a result of the illuminating beam being intercepted and shadowed by the lead is registered.

Abstract: Procedure and system for inspecting a component (1) with leads to determine its fitness for assembly before the component is placed on a circuit board. In the procedure, a narrow illuminating beam (10) is directed at a light-sensitive detector (11). The component (1) and the illuminating beam (10) are moved in relation to each other so that the position as a function of time is known and that the leads (4) of the component pass through the illuminating beam. The illuminating beam thus reaches the light-sensitive detector when it falls between leads, whereas when it falls on leads, the leads cast a shadow, preventing the beam from reaching the light-sensitive detector. The pulse produced by the light-sensitive detector as a result of the illuminating beam being intercepted by the shadowing effect of the leads is registered. Based on the pulse, the width of the lead row and/or the distance between adjacent lead rows are/is computed.