Patents Assigned to PNSensor GmbH
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Patent number: 9407836Abstract: An X-ray camera includes a camera housing, an image pickup element which is sensitive at least for X-rays, and an X-ray objective. The X-ray objective lens has a capillary structure and the image pickup element is constructed as a two-dimensional pixilated semiconductor sensor for simultaneous spatial, energy and time resolution.Type: GrantFiled: October 27, 2009Date of Patent: August 2, 2016Assignees: PNSensor GmbH, IFG-Institute for Scientific Instruments GmbHInventors: Norbert Langhoff, Aniouar Bjeoumikhov, Heike Soltau, Robert Hartmann
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Patent number: 9159518Abstract: The invention concerns a radiation entry window (10) for a radiation detector (2), in particular for a semiconductor drift detector (2), with a flat window element (11), which is at least partially permeable for the radiation to be detected by the radiation detector (2), as well as with a window frame (12), which laterally frames the window element (11), wherein the window frame (12) consists of a semiconductor material and is considerably thicker than the window element (11). (FIG.Type: GrantFiled: August 26, 2011Date of Patent: October 13, 2015Assignees: PNSensor GMBH, Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V.Inventors: Heike Soltau, Bianca Schweinfest, Gerhard Lutz, Ladislav Andricek, Lothar Strueder
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Patent number: 9142702Abstract: The invention relates to a semiconductor drift detector for detecting radiation, comprising a semiconductor substrate (HS), in which signal charge carriers are generated during operation, to be precise by incident photons (h·f) having a specific photon energy, more particularly in the form of X-ray fluorescent radiation, and/or by incident electrons (?), having a specific signal charge carrier current, more particularly in the form of back-scattered electrons (?), and comprising a read-out anode (A) for generating an electrical output signal in a manner dependent on the signal charge carriers, and comprising an erase contact (RC) for erasing the signal charge carriers that have accumulated in the semiconductor substrate (HS).Type: GrantFiled: June 18, 2012Date of Patent: September 22, 2015Assignees: PNDetector GmbH, PNSensor GmbHInventors: Gerhard Lutz, Heike Soltau, Adrian Niculae
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Publication number: 20140332692Abstract: The invention relates to a semiconductor drift detector for detecting radiation, comprising a semiconductor substrate (HS), in which signal charge carriers are generated during operation, to be precise by incident photons (h·f) having a specific photon energy, more particularly in the form of X-ray fluorescent radiation, and/or by incident electrons (?), having a specific signal charge carrier current, more particularly in the form of back-scattered electrons (?), and comprising a read-out anode (A) for generating an electrical output signal in a manner dependent on the signal charge carriers, and comprising an erase contact (RC) for erasing the signal charge carriers that have accumulated in the semiconductor substrate (HS).Type: ApplicationFiled: June 18, 2012Publication date: November 13, 2014Applicants: PNSENSOR GMBH, PNDETECTOR GMBHInventors: Gerhard Lutz, Heike Soltau, Adrian Niculae
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Publication number: 20140008538Abstract: The invention concerns a radiation entry window (10) for a radiation detector (2), in particular for a semiconductor drift detector (2), with a flat window element (11), which is at least partially permeable for the radiation to be detected by the radiation detector (2), as well as with a window frame (12), which laterally frames the window element (11), wherein the window frame (12) consists of a semiconductor material and is considerably thicker than the window element (11).Type: ApplicationFiled: August 26, 2011Publication date: January 9, 2014Applicants: MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN, E.V., PNSENSOR GMBHInventors: Heike Soltau, Bianca Schweinfest, Gerhard Lutz, Ladislav Andricek, Lothar Strueder
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Patent number: 8258594Abstract: The invention relates to an avalanche photodiode (1) for detecting radiation, including a semiconductor substrate (11), an upper diode layer (15), an oppositely doped, laterally delimited lower diode layer (16), an avalanche region situated between the upper diode layer (15) and the lower diode layer (16), wherein the radiation to be detected triggers an avalanche breakdown in the avalanche region, and also including a contact-making layer (12) at the underside (10) of the semiconductor substrate (11), a laterally delimited quenching resistance layer (18) arranged in the semiconductor substrate (11) between the lower diode layer (16) and the contact-making layer (12), wherein the quenching resistance layer (18) quenches the radiation-generated avalanche breakdown in the avalanche region, and also including a depletion electrode (15) arranged laterally alongside the laterally delimited lower diode layer (16), such that the depletion electrode (15) depletes the semiconductor substrate (11) laterally alongside tType: GrantFiled: June 18, 2008Date of Patent: September 4, 2012Assignee: PNSensor GmbHInventors: Rainer Richter, Ladislav Andricek, Gerhard Lutz
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Publication number: 20110293068Abstract: An X-ray camera includes a camera housing, an image pickup element which is sensitive at least for X-rays, and an X-ray objective. The X-ray objective lens has a capillary structure and the image pickup element is constructed as a two-dimensional pixilated semiconductor sensor for simultaneous spatial, energy and time resolution.Type: ApplicationFiled: October 27, 2009Publication date: December 1, 2011Applicants: PNSensor GmbH, IFG-Institute for Scientific Instruments GmbHInventors: Norbert Langhoff, Aniouar Bjeoumikhov, Heike Soltau, Robert Hartmann
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Publication number: 20110095388Abstract: The invention relates to an avalanche photodiode (1) for detecting radiation, including a semiconductor substrate (11), an upper diode layer (15), an oppositely doped, laterally delimited lower diode layer (16), an avalanche region situated between the upper diode layer (15) and the lower diode layer (16), wherein the radiation to be detected triggers an avalanche breakdown in the avalanche region, and also including a contact-making layer (12) at the underside (10) of the semiconductor substrate (11), a laterally delimited quenching resistance layer (18) arranged in the semiconductor substrate (11) between the lower diode layer (16) and the contact-making layer (12), wherein the quenching resistance layer (18) quenches the radiation-generated avalanche breakdown in the avalanche region, and also including a depletion electrode (15) arranged laterally alongside the laterally delimited lower diode layer (16), such that the depletion electrode (15) depletes the semiconductor substrate (11) laterally alongside tType: ApplicationFiled: June 18, 2008Publication date: April 28, 2011Applicants: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V., PNSensor GmbH.Inventors: Rainer Richter, Ladislav Andricek, Gerhard Lutz