Patents Assigned to PNSensor GmbH
  • Patent number: 9407836
    Abstract: An X-ray camera includes a camera housing, an image pickup element which is sensitive at least for X-rays, and an X-ray objective. The X-ray objective lens has a capillary structure and the image pickup element is constructed as a two-dimensional pixilated semiconductor sensor for simultaneous spatial, energy and time resolution.
    Type: Grant
    Filed: October 27, 2009
    Date of Patent: August 2, 2016
    Assignees: PNSensor GmbH, IFG-Institute for Scientific Instruments GmbH
    Inventors: Norbert Langhoff, Aniouar Bjeoumikhov, Heike Soltau, Robert Hartmann
  • Patent number: 9159518
    Abstract: The invention concerns a radiation entry window (10) for a radiation detector (2), in particular for a semiconductor drift detector (2), with a flat window element (11), which is at least partially permeable for the radiation to be detected by the radiation detector (2), as well as with a window frame (12), which laterally frames the window element (11), wherein the window frame (12) consists of a semiconductor material and is considerably thicker than the window element (11). (FIG.
    Type: Grant
    Filed: August 26, 2011
    Date of Patent: October 13, 2015
    Assignees: PNSensor GMBH, Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V.
    Inventors: Heike Soltau, Bianca Schweinfest, Gerhard Lutz, Ladislav Andricek, Lothar Strueder
  • Patent number: 9142702
    Abstract: The invention relates to a semiconductor drift detector for detecting radiation, comprising a semiconductor substrate (HS), in which signal charge carriers are generated during operation, to be precise by incident photons (h·f) having a specific photon energy, more particularly in the form of X-ray fluorescent radiation, and/or by incident electrons (?), having a specific signal charge carrier current, more particularly in the form of back-scattered electrons (?), and comprising a read-out anode (A) for generating an electrical output signal in a manner dependent on the signal charge carriers, and comprising an erase contact (RC) for erasing the signal charge carriers that have accumulated in the semiconductor substrate (HS).
    Type: Grant
    Filed: June 18, 2012
    Date of Patent: September 22, 2015
    Assignees: PNDetector GmbH, PNSensor GmbH
    Inventors: Gerhard Lutz, Heike Soltau, Adrian Niculae
  • Publication number: 20140332692
    Abstract: The invention relates to a semiconductor drift detector for detecting radiation, comprising a semiconductor substrate (HS), in which signal charge carriers are generated during operation, to be precise by incident photons (h·f) having a specific photon energy, more particularly in the form of X-ray fluorescent radiation, and/or by incident electrons (?), having a specific signal charge carrier current, more particularly in the form of back-scattered electrons (?), and comprising a read-out anode (A) for generating an electrical output signal in a manner dependent on the signal charge carriers, and comprising an erase contact (RC) for erasing the signal charge carriers that have accumulated in the semiconductor substrate (HS).
    Type: Application
    Filed: June 18, 2012
    Publication date: November 13, 2014
    Applicants: PNSENSOR GMBH, PNDETECTOR GMBH
    Inventors: Gerhard Lutz, Heike Soltau, Adrian Niculae
  • Publication number: 20140008538
    Abstract: The invention concerns a radiation entry window (10) for a radiation detector (2), in particular for a semiconductor drift detector (2), with a flat window element (11), which is at least partially permeable for the radiation to be detected by the radiation detector (2), as well as with a window frame (12), which laterally frames the window element (11), wherein the window frame (12) consists of a semiconductor material and is considerably thicker than the window element (11).
    Type: Application
    Filed: August 26, 2011
    Publication date: January 9, 2014
    Applicants: MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN, E.V., PNSENSOR GMBH
    Inventors: Heike Soltau, Bianca Schweinfest, Gerhard Lutz, Ladislav Andricek, Lothar Strueder
  • Patent number: 8258594
    Abstract: The invention relates to an avalanche photodiode (1) for detecting radiation, including a semiconductor substrate (11), an upper diode layer (15), an oppositely doped, laterally delimited lower diode layer (16), an avalanche region situated between the upper diode layer (15) and the lower diode layer (16), wherein the radiation to be detected triggers an avalanche breakdown in the avalanche region, and also including a contact-making layer (12) at the underside (10) of the semiconductor substrate (11), a laterally delimited quenching resistance layer (18) arranged in the semiconductor substrate (11) between the lower diode layer (16) and the contact-making layer (12), wherein the quenching resistance layer (18) quenches the radiation-generated avalanche breakdown in the avalanche region, and also including a depletion electrode (15) arranged laterally alongside the laterally delimited lower diode layer (16), such that the depletion electrode (15) depletes the semiconductor substrate (11) laterally alongside t
    Type: Grant
    Filed: June 18, 2008
    Date of Patent: September 4, 2012
    Assignee: PNSensor GmbH
    Inventors: Rainer Richter, Ladislav Andricek, Gerhard Lutz
  • Publication number: 20110293068
    Abstract: An X-ray camera includes a camera housing, an image pickup element which is sensitive at least for X-rays, and an X-ray objective. The X-ray objective lens has a capillary structure and the image pickup element is constructed as a two-dimensional pixilated semiconductor sensor for simultaneous spatial, energy and time resolution.
    Type: Application
    Filed: October 27, 2009
    Publication date: December 1, 2011
    Applicants: PNSensor GmbH, IFG-Institute for Scientific Instruments GmbH
    Inventors: Norbert Langhoff, Aniouar Bjeoumikhov, Heike Soltau, Robert Hartmann
  • Publication number: 20110095388
    Abstract: The invention relates to an avalanche photodiode (1) for detecting radiation, including a semiconductor substrate (11), an upper diode layer (15), an oppositely doped, laterally delimited lower diode layer (16), an avalanche region situated between the upper diode layer (15) and the lower diode layer (16), wherein the radiation to be detected triggers an avalanche breakdown in the avalanche region, and also including a contact-making layer (12) at the underside (10) of the semiconductor substrate (11), a laterally delimited quenching resistance layer (18) arranged in the semiconductor substrate (11) between the lower diode layer (16) and the contact-making layer (12), wherein the quenching resistance layer (18) quenches the radiation-generated avalanche breakdown in the avalanche region, and also including a depletion electrode (15) arranged laterally alongside the laterally delimited lower diode layer (16), such that the depletion electrode (15) depletes the semiconductor substrate (11) laterally alongside t
    Type: Application
    Filed: June 18, 2008
    Publication date: April 28, 2011
    Applicants: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V., PNSensor GmbH.
    Inventors: Rainer Richter, Ladislav Andricek, Gerhard Lutz