Abstract: A system and methods are provided for robot-assisted, interactive testing of electronic circuits comprising a test fixture comprising a robotic arm, a probe, and a bracket configured to hold a unit-under-test, wherein the probe is configured to be mounted on the robotic arm and to perform a probe action, and a computer system communicatively connected to the test fixture and comprising a graphics display, a user input device. The computer system is configured to present on the graphics display a logic schematic of the unit-under-test, to receive a user selection of a target element shown on the logic schematic, to determine the corresponding physical location on the unit-under-test of said element, to move the probe to the physical location of the target element, by means of the robotic arm, and to perform one or more probe actions.