Abstract: Provided herein are systems and methods for an intelligent diagnostic probe configured to provide troubleshooting guidance during diagnosing faults within vehicle electrical systems. The intelligent diagnostic probe is configured, in some embodiments, to receive raw measurement data, such as voltage, current, and resistance, from tools and take the data into an intelligence system so as to interpret the data and provide actionable output for practitioners operating the intelligent diagnostic probe. The intelligent diagnostic probe is configured, in some embodiments, to divide vehicle electrical diagnosis procedures of into segments, include appropriate tolerance ranges for readings, and provide feedback and suggestions regarding the readings. The intelligent diagnostic probe is configured, in some embodiments, to operate as an artificial intelligence that uses a large number of previously coded measurements to learn to accurately diagnose electrical faults based on currently measured raw data.

Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.

Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.

Abstract: An apparatus and a method are provided for a modular lighting system. In one embodiment, the modular lighting system comprises a compact and lightweight outer enclosure that features a plurality of lighting elements. It is envisioned that a subsection of the lighting elements is static, in that it may not be removed from the outer enclosure. The plurality of lighting elements are configured so that they may be detached from the outer enclosure and placed at locations based on the user's discretion so as to substantially reduce shadows and illuminate key areas. The modular lighting system may be operated wirelessly. In at least one embodiment, the detachable lighting elements include independent power sources.

Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.