Abstract: In a non-volatile semiconductor memory device outputting a data value determined according to a majority rule by reading-out data from each memory cell for an odd number of times, an odd number of latch circuits, each of which comprises a capacitor for selectively holding a voltage of each of the data read-out from the memory cell for the odd number of times in sequence, is provided. The capacitor of each latch circuit is connected in parallel after the capacitor of each latch circuit selectively holds the voltage of each of the data read-out from the memory cell for the odd number of times in sequence, and the data value is determined by the majority rule based on a composite voltage of the capacitor of each latch circuit connected in parallel.

Abstract: A semiconductor chip D1 of a flash memory which is stacked together with other semiconductor chips D2˜DN to form a multi-chip package (MCP), including a memory cell array 20 of the flash memory for storing an ID code and an upper address, wherein the ID code is written into the a fuse data region 20F of the memory cell array 20 before the assembly process. According to the invention, ID codes and upper addresses can be assigned and written to each of the semiconductor chips of a multi-chip package easily without increasing the size of the semiconductor chips in comparison with the prior art.

Abstract: A nonvolatile memory cell array is divided into first and second cell arrays, the page buffer circuit is arranged between the first and second cell arrays, a second latch circuit is arranged by the outside edge section of the first cell array, and the page buffer circuit is connected to the second latch circuit via a global bit line of the first cell array. The data writing to the first or second cell array is controlled by transmitting the writing data to the page buffer circuit via the global bit line from the second latch circuit, after the writing data is latched in the second latch circuit. The data reading of outputting the data read from the first or second cell array to the external circuit is controlled by transmitting data to the second latch circuit from the page buffer circuit via the global bit line.

Abstract: A level shift circuit, for outputting a data output signal with a second level via an output inverter after a data input signal with a first level is stored in a latch, includes a level set circuit, when the output data signal outputs with a low level, setting the output data signal to a low level in response to a change of the input data signal. The level set circuit is connected to an output terminal of the output inverter, and has an NMOS transistor having a drain electrode and a source electrode coupled to a ground, wherein the NMOS transistor turns on in response to the input data signal with a high level.

Abstract: TASK: to provide an internal voltage trimming circuit having a simple configuration and operated by a consumption current smaller than that using a comparator. MEANS FOR SOLVING THE PROBLEM: An internal voltage trimming circuit comprises a trimming controller using a change in a counting value of a clock according to a current flowing through a transistor of a power supply current source for a clock generator to trim an internal voltage generated by an internal voltage generator. The trimming controller counts a first counting value of the clock when a predetermined reference voltage is applied to a control terminal of the transistor and a second counting value of the clock when the internal voltage is applied to the control terminal of the transistor and controls the internal voltage generated by the internal voltage generator to substantially coincide the second counting value with the first counting value.