Abstract: A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.
Type:
Grant
Filed:
June 27, 2008
Date of Patent:
March 18, 2014
Assignee:
PPI Systems, Inc.
Inventors:
Anton Theodore Kitai, Paul Andrew Labelle, Robert Glenn Parker, David R. Walker
Abstract: A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.
Type:
Application
Filed:
June 27, 2008
Publication date:
October 28, 2010
Applicant:
PPI Systems, Inc.
Inventors:
Anton Theodore Kitai, Paul Andrew Labelle, Robert Glenn Parker, David R. Walker