Patents Assigned to Pragma Design, Inc.
  • Field collapse pulser
    Patent number: 11609256
    Abstract: Disclosed are exemplary embodiments of electrostatic discharge (ESD) pulse generators that may provide improved system level ESD robustness characterization and qualification analysis.
    Type: Grant
    Filed: May 14, 2021
    Date of Patent: March 21, 2023
    Assignee: Pragma Design, Inc.
    Inventor: Jeffrey C. Dunnihoo
  • Embedded transient scanning systems, transient scanning data visualization systems, and/or related methods
    Patent number: 10191109
    Abstract: Disclosed are exemplary embodiments of transient scanning data visualization methods and systems. Also disclosed are exemplary embodiments of embedded transient scanning systems and methods.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: January 29, 2019
    Assignee: Pragma Design, Inc.
    Inventors: Jeffrey C. Dunnihoo, Rayfes Ahmed Mondal
  • Embedded transient scanning system apparatus and methodology
    Patent number: 9297852
    Abstract: Systems and methods for scanning and characterizing an integrated circuit for transient events. Embedded apparatus can detect transient events that may be incident on the integrated circuit, and moreover, identify particular nodes of the integrated circuit that are affected by the transient event. Additionally, the integrated circuit can be characterized by applying known transient pulses of varying severity to selected nodes of the integrated circuit, detecting the severity levels at which the selected nodes can fail, and storing indications pertaining to pulse severity at which selected nodes can fail. Moreover, based on the characterization, targeted protection mechanisms can be provided for nodes that are characterized as being susceptible.
    Type: Grant
    Filed: October 31, 2012
    Date of Patent: March 29, 2016
    Assignee: PRAGMA DESIGN, INC.
    Inventor: Jeffrey C. Dunnihoo
  • EMBEDDED TRANSIENT SCANNING SYSTEM APPARATUS AND METHODOLOGY
    Publication number: 20130132007
    Abstract: Systems and methods for scanning and characterizing an integrated circuit for transient events. Embedded apparatus can detect transient events that may be incident on the integrated circuit, and moreover, identify particular nodes of the integrated circuit that are affected by the transient event. Additionally, the integrated circuit can be characterized by applying known transient pulses of varying severity to selected nodes of the integrated circuit, detecting the severity levels at which the selected nodes can fail, and storing indications pertaining to pulse severity at which selected nodes can fail. Moreover, based on the characterization, targeted protection mechanisms can be provided for nodes that are characterized as being susceptible.
    Type: Application
    Filed: October 31, 2012
    Publication date: May 23, 2013
    Applicant: Pragma Design, Inc.
    Inventor: Pragma Design, Inc.