Abstract: An improved circuit, and an improved device geometry for trimming element values in an integrated circuit employs selectable short-circuiting of fusible elements by means of application of a prescribed sequence of electrical waveforms of prescribed amplitude and polarity. The improved trim circuit configuration offers the possibility of improved trim circuit density by allowing selection of three trim elements from a single contact pad, in conjunction with a common contact pad, for each trim circuit. Replication of the circuits allows extension of the range of adjustment or of the resolution of the trim, at the expense of only one additional pad per each additional trim circuit. A unique device geometry is described for implementing the improved trim circuit within a single isolation pocket of an integrated circuit.