Patents Assigned to Precision Moisture Instruments, Inc.
  • Apparatus and methods for generating unambiguous large amplitude timing makers in time domain reflectometry systems for measuring propagation velocities of RF pulses to determine material liquid contents moisture
    Patent number: 6104200
    Abstract: Time Domain Reflectometry ("TDR") methods and apparatus for measuring propagation velocities of RF pulses to determine material liquid contents, moisture profiles, material levels and dielectric constants including: i) TDR probes and/or probe adaptors, including series averaging probes and multi-segment probes, all employing remotely operable, normally open, variable impedance devices such as diodes; ii) bias insertion and switching networks for rendering selected normally open variable impedance devices conductive one at a time to establish precise unambiguous timing markers T.sub.1 . . . T.sub.
    Type: Grant
    Filed: March 6, 1998
    Date of Patent: August 15, 2000
    Assignee: Precision Moisture Instruments, Inc.
    Inventor: William R. Hook
  • Apparatus and methods for time domain reflectometry
    Patent number: 5726578
    Abstract: Time Domain Reflectometry ("TDR") methods and apparatus for measuring propagation velocities of RF pulses to determine material liquid contents, moisture profiles, material levels and dielectric constants including: i) TDR probes and/or probe adaptors, including series averaging probes and multi-segment probes, all employing remotely operable, normally open, variable impedance devices such as diodes; ii) bias insertion and switching networks for rendering selected normally open variable impedance devices conductive one at a time to establish precise unambiguous timing markers T.sub.1 . . . T.sub.
    Type: Grant
    Filed: November 17, 1994
    Date of Patent: March 10, 1998
    Assignee: Precision Moisture Instruments, Inc.
    Inventor: William R. Hook