Abstract: A curve trace analysis testing apparatus controller is provided having a Graphical User Interface electrically connected to a Device Under Test (DUT) by any pin or combination of pins, the DUT being mountable to independent analog channels in the TAC using an electrical connection interface. The TAC can contain 3 different board assemblies: a System Motherboard, a Microprocessor assembly, and TAC Modules. The TAC Modules can have TAC shift registers and solid state switches, and each TAC Module can support a block of pins and at least 2 analog channels.
Type:
Grant
Filed:
November 10, 2015
Date of Patent:
March 2, 2021
Assignee:
Priority Labs, Inc.
Inventors:
Monte Drennan, Craig Ward, Scott Lisula, Kenny Keese, John Drummond