Patents Assigned to Probe Innovation, Inc.
  • Publication number: 20230408549
    Abstract: Under the conditions that an abrasive cleaning gel film having an abrasive cleaning gel layer and being configured to be stuck to a surface or a container filled with a viscous fluid or a gel fluid in which fine abrasive grains are mixed and dispersed is attached to a vibrating surface of an ultrasonic transducer, and an axial direction of a probe for test is matched with a vibrating direction of the ultrasonic transducer, a tip of the probe is penetrated to a predetermined depth in the abrasive cleaning gel layer or the viscous fluid in which the fine abrasive grains are mixed and dispersed at a constant speed and then pulled up at a constant speed, whereby the tip of the probe can be formed into a conical shape.
    Type: Application
    Filed: February 2, 2023
    Publication date: December 21, 2023
    Applicant: Probe Innovation, Inc.
    Inventors: Akiko IWANA, Tadashi ROKKAKU, Masafumi YAMASHITA
  • Patent number: 10996243
    Abstract: The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: May 4, 2021
    Assignee: PROBE INNOVATION, INC.
    Inventors: Akiko Iwana, Tadashi Rokkaku, Nobuo Iwakuni
  • Publication number: 20200182908
    Abstract: The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.
    Type: Application
    Filed: July 5, 2019
    Publication date: June 11, 2020
    Applicant: Probe Innovation, Inc.
    Inventors: Akiko IWANA, Tadashi Rokkaku, Nobuo IWAKUNI