Patents Assigned to Probe Rite, Inc.
  • Multi-point test probe
    Patent number: 4055805
    Abstract: A multi-point probe head assembly for providing electro-mechanical interface contact with miniature electronic devices and including a rigid support member, a plurality of probe tips each attached to a probe arm, and adjustment means for adjusting the relative position of each probe tip in three orthogonal planes.
    Type: Grant
    Filed: June 28, 1976
    Date of Patent: October 25, 1977
    Assignee: Probe Rite, Inc.
    Inventor: Frank J. Ardezzone