Abstract: A test probe head assembly having a probe assembly comprising a plurality of probe arms with terminal probe-points mounted on a support member with means for transmitting electrical signals between an external signal source and the probe's arms. The probe-points are resiliently mounted on the probe assembly which is itself capable of deflection.

Abstract: A surface mating coaxial connector for use in transmitting signals to an electronic device. The connector has a contact pin electrically and mechanically connected to a central conductor of a small coaxial cable through an axially-moveable connection means. The shielding of the coaxial cable is extended from the cable over the length of the connector including the contact pin by a shield extension means which minimizes interference from adjacent contact pins. An insulation means electrically isolates the shield extension means from the contact pin and the axially-moveable connection means and is configured such that the impedance of the coaxial cable is maintained to the point of contact of the contact pin. The contact pin and a shield collar which surrounds the contact pin are independently and automatically adjustable in the axial direction to compensate for height variations of the surface on which contact is made.

Abstract: A inker network for use with a tester and a probing machine for marking semiconductor wafers and including a delay circuit for receiving clocking pulses and a first ink command pulse from the tester and for generating a delayed ink command pulse which is delayed an integer number of clock pulses, a direction detector for receiving first and second transport signals from the probing machine and for generating first and second direction signals dependent on the direction the wafer is being transported, and a steering circuit responsive to the delayed pulse in one mode and for generating a double pulse of adjustment width and amplitude on first or second output lines in response to the first and second direction signals, respectively, and in a second mode for generating the double pulse of adjustment width and amplitude on the first or second or both of the output lines in response to the first or second ink command pulse from the tester or both pulses simultaneously, respectively.

Abstract: A multi-point probe head assembly for providing electro-mechanical interface contact with miniature electronic devices and including a rigid support member, a plurality of probe tips each attached to a probe arm, and adjustment means for adjusting the relative position of each probe tip in three orthogonal planes.