Patents Assigned to Process Metrix
  • Publication number: 20220373320
    Abstract: A scanner assembly is configured to be mounted on a scanner manipulator arm, to be placed in proximity to an opening in a vessel or inserted into an opening in a vessel, and to measure distances from a scanner emitter/sensor within the scanner assembly to a plurality of points on the surface of the refractory lining to characterize the concave interior of the vessel in a single scan. A scanner manipulator having a manipulator arm attached to the scanner assembly maintains the scanner assembly in measurement positions. A control system controls the position of the scanner assembly, the orientation of the emitter sensor, and the acquisition, storage, processing and presentation of measurements produced by the emitter/sensor. The field of view obtained from the scanner assembly in a single scan exceeds a hemisphere.
    Type: Application
    Filed: June 4, 2020
    Publication date: November 24, 2022
    Applicant: PROCESS METRIX, LLC
    Inventor: Michel P. Bonin
  • Patent number: 10175040
    Abstract: Apparatuses, methods, and systems are disclosed for autonomously characterizing the refractory lining in a container using an scanner that includes a scanning laser range finding system, a control system being communicatively connected to the laser scanning system to control the scanner; and a robotic vehicle having a controller communicatively connected to the control system and a drive system to propel the scanner autonomously in an area adjacent to the container, wherein characterization of the refractory lining is performed by comparing refractory thickness values determined from the distances measured from the laser scanning system to the surface of the refractory lining and the relative position of the scanner and the container, and comparing the same to a reference measurement of the refractory lining.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: January 8, 2019
    Assignee: PROCESS METRIX
    Inventors: Michel Pierre Bonin, Jared Hubert Hoog
  • Patent number: 10060725
    Abstract: Apparatuses, methods, and systems are disclosed to characterize the wear and measure temperature of a surface of a lining of a metallurgical container. Wear characterization is accomplished by a scanning device by making thickness measurements of the lining and surface temperature measurements are made using a two-color pyrometer integrated with the scanning device where surface temperature is measured by correlating a ratio of two light intensities to the surface temperature. A controller controls operation of the scanning device and the two-color pyrometer.
    Type: Grant
    Filed: November 20, 2016
    Date of Patent: August 28, 2018
    Assignee: PROCESS METRIX
    Inventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Alan Stanley Alsing
  • Publication number: 20180143004
    Abstract: Apparatuses, methods, and systems are disclosed to characterize the wear and measure temperature of a surface of a lining of a metallurgical container. Wear characterization is accomplished by a scanning device by making thickness measurements of the lining and surface temperature measurements are made using a two-color pyrometer integrated with the scanning device where surface temperature is measured by correlating a ratio of two light intensities to the surface temperature. A controller controls operation of the scanning device and the two-color pyrometer.
    Type: Application
    Filed: November 20, 2016
    Publication date: May 24, 2018
    Applicant: Process Metrix
    Inventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Alan Stanley Alsing
  • Patent number: 9435889
    Abstract: Apparatuses, methods, and systems are disclosed for the characterization of the integrity and profile measurement of a caster mold by use of a scanning device, a positioning fixture, and a data reduction device connected to the scanning device, the data reduction device being configured to characterize the integrity and to measure the profile of the caster mold by comparing scanned distances to reference distance values.
    Type: Grant
    Filed: June 2, 2014
    Date of Patent: September 6, 2016
    Assignee: PROCESS METRIX
    Inventors: Michel Pierre Bonin, Thomas Lawrence Harvill
  • Patent number: 9279773
    Abstract: Apparatuses, methods, and systems are disclosed to detect and measure cracks in the lining of a container. A typical apparatus includes a scanning device to acquire a cloud of data points by measuring distances from the scanning device to a plurality of points on the surface of lining material and a controller to fit a polygonal mesh and a minimum surface through the cloud of data points, a crack being detected by a portion of the polygonal mesh containing a connected group of polygons that extends past the minimum surface beyond a threshold distance.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: March 8, 2016
    Assignee: PROCESS METRIX
    Inventor: Thomas Lawrence Harvill
  • Publication number: 20150168552
    Abstract: Apparatuses, methods, and systems are disclosed for the characterization of the integrity and profile measurement of a caster mold by use of a scanning device, a positioning fixture, and a data reduction device connected to the scanning device, the data reduction device being configured to characterize the integrity and to measure the profile of the caster mold by comparing scanned distances to reference distance values.
    Type: Application
    Filed: June 2, 2014
    Publication date: June 18, 2015
    Applicant: Process Metrix
    Inventors: Michel Pierre Bonin, Thomas Lawrence Harvill
  • Patent number: 8958058
    Abstract: Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.
    Type: Grant
    Filed: November 15, 2011
    Date of Patent: February 17, 2015
    Assignee: Process Metrix
    Inventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Jared Hubert Hoog
  • Publication number: 20130120738
    Abstract: Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.
    Type: Application
    Filed: November 15, 2011
    Publication date: May 16, 2013
    Applicant: PROCESS METRIX
    Inventors: Michel Pierre BONIN, Thomas Lawrence HARVILL, Jared Hubert HOOG
  • Patent number: 8040508
    Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.
    Type: Grant
    Filed: July 13, 2010
    Date of Patent: October 18, 2011
    Assignee: Process Metrix
    Inventor: Donald John Holve
  • Publication number: 20100277733
    Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.
    Type: Application
    Filed: July 13, 2010
    Publication date: November 4, 2010
    Applicant: PROCESS METRIX
    Inventor: Donald John Holve
  • Patent number: 7782459
    Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.
    Type: Grant
    Filed: June 20, 2008
    Date of Patent: August 24, 2010
    Assignee: Process Metrix
    Inventor: Donald John Holve
  • Publication number: 20090079981
    Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.
    Type: Application
    Filed: June 20, 2008
    Publication date: March 26, 2009
    Applicant: PROCESS METRIX
    Inventor: Donald John Holve