Patents Assigned to Process Metrix
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Publication number: 20220373320Abstract: A scanner assembly is configured to be mounted on a scanner manipulator arm, to be placed in proximity to an opening in a vessel or inserted into an opening in a vessel, and to measure distances from a scanner emitter/sensor within the scanner assembly to a plurality of points on the surface of the refractory lining to characterize the concave interior of the vessel in a single scan. A scanner manipulator having a manipulator arm attached to the scanner assembly maintains the scanner assembly in measurement positions. A control system controls the position of the scanner assembly, the orientation of the emitter sensor, and the acquisition, storage, processing and presentation of measurements produced by the emitter/sensor. The field of view obtained from the scanner assembly in a single scan exceeds a hemisphere.Type: ApplicationFiled: June 4, 2020Publication date: November 24, 2022Applicant: PROCESS METRIX, LLCInventor: Michel P. Bonin
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Patent number: 10175040Abstract: Apparatuses, methods, and systems are disclosed for autonomously characterizing the refractory lining in a container using an scanner that includes a scanning laser range finding system, a control system being communicatively connected to the laser scanning system to control the scanner; and a robotic vehicle having a controller communicatively connected to the control system and a drive system to propel the scanner autonomously in an area adjacent to the container, wherein characterization of the refractory lining is performed by comparing refractory thickness values determined from the distances measured from the laser scanning system to the surface of the refractory lining and the relative position of the scanner and the container, and comparing the same to a reference measurement of the refractory lining.Type: GrantFiled: March 20, 2015Date of Patent: January 8, 2019Assignee: PROCESS METRIXInventors: Michel Pierre Bonin, Jared Hubert Hoog
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Patent number: 10060725Abstract: Apparatuses, methods, and systems are disclosed to characterize the wear and measure temperature of a surface of a lining of a metallurgical container. Wear characterization is accomplished by a scanning device by making thickness measurements of the lining and surface temperature measurements are made using a two-color pyrometer integrated with the scanning device where surface temperature is measured by correlating a ratio of two light intensities to the surface temperature. A controller controls operation of the scanning device and the two-color pyrometer.Type: GrantFiled: November 20, 2016Date of Patent: August 28, 2018Assignee: PROCESS METRIXInventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Alan Stanley Alsing
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Publication number: 20180143004Abstract: Apparatuses, methods, and systems are disclosed to characterize the wear and measure temperature of a surface of a lining of a metallurgical container. Wear characterization is accomplished by a scanning device by making thickness measurements of the lining and surface temperature measurements are made using a two-color pyrometer integrated with the scanning device where surface temperature is measured by correlating a ratio of two light intensities to the surface temperature. A controller controls operation of the scanning device and the two-color pyrometer.Type: ApplicationFiled: November 20, 2016Publication date: May 24, 2018Applicant: Process MetrixInventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Alan Stanley Alsing
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Patent number: 9435889Abstract: Apparatuses, methods, and systems are disclosed for the characterization of the integrity and profile measurement of a caster mold by use of a scanning device, a positioning fixture, and a data reduction device connected to the scanning device, the data reduction device being configured to characterize the integrity and to measure the profile of the caster mold by comparing scanned distances to reference distance values.Type: GrantFiled: June 2, 2014Date of Patent: September 6, 2016Assignee: PROCESS METRIXInventors: Michel Pierre Bonin, Thomas Lawrence Harvill
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Patent number: 9279773Abstract: Apparatuses, methods, and systems are disclosed to detect and measure cracks in the lining of a container. A typical apparatus includes a scanning device to acquire a cloud of data points by measuring distances from the scanning device to a plurality of points on the surface of lining material and a controller to fit a polygonal mesh and a minimum surface through the cloud of data points, a crack being detected by a portion of the polygonal mesh containing a connected group of polygons that extends past the minimum surface beyond a threshold distance.Type: GrantFiled: March 20, 2015Date of Patent: March 8, 2016Assignee: PROCESS METRIXInventor: Thomas Lawrence Harvill
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Publication number: 20150168552Abstract: Apparatuses, methods, and systems are disclosed for the characterization of the integrity and profile measurement of a caster mold by use of a scanning device, a positioning fixture, and a data reduction device connected to the scanning device, the data reduction device being configured to characterize the integrity and to measure the profile of the caster mold by comparing scanned distances to reference distance values.Type: ApplicationFiled: June 2, 2014Publication date: June 18, 2015Applicant: Process MetrixInventors: Michel Pierre Bonin, Thomas Lawrence Harvill
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Patent number: 8958058Abstract: Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.Type: GrantFiled: November 15, 2011Date of Patent: February 17, 2015Assignee: Process MetrixInventors: Michel Pierre Bonin, Thomas Lawrence Harvill, Jared Hubert Hoog
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Publication number: 20130120738Abstract: Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.Type: ApplicationFiled: November 15, 2011Publication date: May 16, 2013Applicant: PROCESS METRIXInventors: Michel Pierre BONIN, Thomas Lawrence HARVILL, Jared Hubert HOOG
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Patent number: 8040508Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.Type: GrantFiled: July 13, 2010Date of Patent: October 18, 2011Assignee: Process MetrixInventor: Donald John Holve
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Publication number: 20100277733Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.Type: ApplicationFiled: July 13, 2010Publication date: November 4, 2010Applicant: PROCESS METRIXInventor: Donald John Holve
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Patent number: 7782459Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.Type: GrantFiled: June 20, 2008Date of Patent: August 24, 2010Assignee: Process MetrixInventor: Donald John Holve
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Publication number: 20090079981Abstract: Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.Type: ApplicationFiled: June 20, 2008Publication date: March 26, 2009Applicant: PROCESS METRIXInventor: Donald John Holve