Abstract: Apparatuses of a noise measurement system and methods for using the same are disclosed. In one embodiment, a noise measurement system may include a plurality of probe groups electrically coupled to a plurality of DUTs, where a probe group in the plurality of probe groups includes multiple channels, and where the multiple channels of each probe group are bundled as a group for reducing electromagnetic interference among the plurality of probe groups, and wherein the group is shielded from corresponding signal groups of other DUTs with a connection to a circuit ground of the noise measurement system for reducing ground loop generated signal interference. The noise measurement system may further include a controller configured to perform noise measurement.

Abstract: Embodiments of apparatuses of a synchronized noise measurement system and methods for using the same are disclosed. In one embodiment, a method of performing noise measurement includes setting up a plurality of device under tests (DUTs), performing noise measurement of the plurality of DUTs synchronously using programmable testing parameters to generate a noise measurement data, collecting the noise measurement data from the plurality of DUTs in parallel, and analyzing the noise measurement data collected to identify deviations in noise performance caused by manufacturing process variations or environmental variations for the plurality of DUTs.

Abstract: Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, an amplification circuit configured to amplify an output signal of the DUT, a second circuit path configured to drive a second terminal of the DUT, a third circuit path configured to couple a third terminal of the DUT to a circuit ground, and a decoupling circuit configured to decouple the DUT and the amplification circuit, logic configured to detect output signal characteristics of the DUT, logic configured to adjust input impedance of the amplification circuit based on the output signal characteristics of the DUT, and logic configured to measure a flicker noise of the DUT using the amplification circuit with adjusted input impedance.

Abstract: Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, a charging circuit path configured to charge the first terminal of the DUT in a setup phase, and logic configured to charge the first terminal of the DUT to a predetermined voltage using the first circuit path and the charging circuit path in the setup phase.

Abstract: Methods and systems are disclosed for naming methodologies for a hierarchical system. In one embodiment, a computer implemented method of organizing instance names in a hierarchical system includes receiving a description of a hierarchical system that includes plurality of instances arranged in different branches in a plurality of hierarchical levels in a physical data structure, creating an instance name data structure configured to describe the corresponding instances in the hierarchical system, where the instance name data structure comprises a map of indexes and a corresponding array of offsets configured to access naming information in a subsequent level, and associating names of instances in the hierarchical system to a corresponding set of unique integers which are arranged in a sequential manner.