Patents Assigned to Proteoptics, Ltd.
  • Patent number: 6970249
    Abstract: A device for measuring simultaneously the phase at each point of an image formed by light reflected from a sample in which the phase has been modified by plasma resonance in a thin conducting layer, the device comprising a thick transparent substrate (10) on which a thin layer of conducting material is deposited (13); a light source (1); an interferometer; an imaging means (9); and a processing means.
    Type: Grant
    Filed: September 12, 2000
    Date of Patent: November 29, 2005
    Assignee: Proteoptics, Ltd.
    Inventors: Stephen Lipson, Ariel Notcovich